Technique to analyze and report accurate data, synchronizing multiple signals in a memory chip

A test and measurement system, comprising:

• a multi-stack test subsystem including a plurality of test and measurement instruments, each of the plurality of test and measurement instruments configured to be coupled to a device under test (DUT) to receive a plurality of test signals from the DUT during a test mode of operation, one of the plurality of test and measurement instruments being designated as a master test and measurement instrument and the remainder of the plurality of test and measurements instruments being designated as extension test and measurement instruments, the master test and measurement instrument configured to communicate control signals to each of the plurality of extension test and measurement instruments to synchronize the plurality of test and measurement instruments to simultaneously acquire the plurality of test signals provided by the DUT;
• and
• an automation engine coupled to the multi-stack test subsystem to receive the acquired plurality of test signals from the master one of the plurality of test and measurement instruments, the automation engine configured to analyze the acquired plurality of test signals to perform validation testing for each of the plurality of test signals and simultaneously display results of the validation testing for the plurality of test signals,
• wherein each of the plurality of test and measurement instruments comprises an oscilloscope.

A test and measurement system, comprising:

• a multi-stack test subsystem, including:
• a plurality of extension oscilloscopes, each oscilloscope configured to be coupled to a device under test (DUT) to receive a plurality of test signals from the DUT during a validation test mode of operation;
• a master oscilloscope coupled to the plurality of extension oscilloscopes, the master oscilloscope configured to be coupled to the DUT to receive a plurality of test signals from the DUT during the validation test mode of operation, and the master oscilloscope further configured to communicate control signals to each of the plurality of extension oscilloscopes to synchronize the plurality oscilloscopes to simultaneously acquire the plurality of test signals provided by the DUT;
• and
• an automation engine coupled to the multi-stack test subsystem to receive the acquired plurality of test signals from the master oscilloscope, the automation engine configured to analyze the acquired plurality of test signals to perform validation testing for each of plurality of test signals and simultaneously display results of the validation testing for the plurality of test signals.