Voltage and clock margin testing of memory-modules using an adapter board mounted to a PC motherboard

A method for margin testing memory modules using a motherboard-based tester comprising:

• executing a test program on a motherboard;
• specifying a first test power-supply voltage that differs from a nominal power-supply voltage on the motherboard by a first voltage margin;
• applying the first test power-supply voltage to a memory module under test, the memory module under test being connected to a memory bus on the motherboard by a test adapter board with a test socket for connecting to the memory module under test;
• the test program executing instructions to write to the memory module under test and to read from the memory module under test, when the memory module under test has the first test power-supply voltage applied;
• specifying a second test power-supply voltage that differs from the nominal power-supply voltage on the motherboard by a second voltage margin, the second voltage margin differing from the first voltage margin;
• applying the second test power-supply voltage to the memory module under test;
• and
• the test program executing instructions to write to the memory module under test and to read from the memory module under test, when the memory module under test has the second test power-supply voltage applied,
• whereby the memory module under test is tested at two different voltage margins.

A memory-module margin tester comprising:

• test adapter board means for electrically connecting to a memory module under test;
• motherboard means for executing a test program means for testing the memory module under test, the motherboard means including expansion-bus means for accepting expansion cards, and memory means for storing data, the memory means including local memory means for storing data on the motherboard means, and a connection means for connecting the memory means to the memory module under test through the test adapter board means;
• and
• voltage margin means, coupled to the test adapter board means, for varying a power-supply voltage to the memory module under test in response to the test program means, the voltage margin means not adjusting a power-supply voltage to the local memory means;
• whereby the power-supply voltage to the memory module under test is varied in response to the test program means during margin testing.