G11C 2029/5606
Error catch memory
Official title: {Error catch memory}
G11C2029/5606 (Error catch memory) appears on 142 US grants and 152 published applications in this corpus.
Search patents in G11C- Granted patents
- 142
- Published applications
- 152
- Assignees
- 64
- Inventors
- 318
- Latest grant
- 1 Jul 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 2 | 6 |
| 2003 | 7 | 21 |
| 2004 | 11 | 13 |
| 2005 | 8 | 6 |
| 2006 | 9 | 11 |
| 2007 | 11 | 13 |
| 2008 | 16 | 13 |
| 2009 | 8 | 7 |
| 2010 | 5 | 9 |
| 2011 | 8 | 5 |
| 2012 | 6 | 7 |
| 2013 | 5 | 2 |
| 2014 | 5 | 4 |
| 2015 | 4 | 4 |
| 2016 | 4 | 1 |
| 2017 | 4 | 4 |
| 2018 | 3 | 4 |
| 2019 | 7 | 5 |
| 2020 | 5 | 3 |
| 2021 | 3 | 5 |
| 2022 | 1 | 4 |
| 2023 | 3 | 0 |
| 2024 | 4 | 1 |
| 2025 | 1 | 3 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Interface read after write1 Jul 2025US 12,346,603 B2Micron Technology, Inc.
- Method for testing memory by built-in self-test storage space and related device23 Jul 2024US 12,045,150 B2Changxin Memory Technologies, Inc.
- Interface read after write20 Feb 2024US 11,907,572 B2Micron Technology, Inc.
- Memory device test method, apparatus, and system, medium, and electronic device9 Jan 2024US 11,867,755 B2Changxin Memory Technologies, Inc.
- Test method for control chip and related device9 Jan 2024US 11,867,758 B2Changxin Memory Technologies, Inc.
- User-enabled test mode patterns29 Jan 2026US 2026/0031180 A1Micron Technology, Inc.
- Interface read after write22 May 2025US 2025/0165191 A1Micron Technology, Inc.
- Method for storing memory fault data, apparatus and computer program for performing the method24 Apr 2025US 2025/0130881 A1UIF (University Industry Foundation), Yonsei University
- Non-linear memory failure analysis method and memory test apparatus2 Jan 2025US 2025/0006286 A1UIF (University Industry Foundation), Yonsei University
- Interface read after write9 May 2024US 2024/0152294 A1Micron Technology, Inc.
Most cited
By later US patents
- Redundancy analysis for embedded memories with built-in self test and built-in self repair308US 6,067,262 ALSI Logic Corporation · 2000
- System and method for self-testing and repair of memory modules168US 6,754,117 B2Micron Technology, Inc. · 2004
- Distributed interface for parallel testing of multiple devices using a single tester channel107US 6,499,121 B1FormFactor, Inc. · 2002
- Distributed interface for parallel testing of multiple devices using a single tester channel76US 6,678,850 B2FormFactor, Inc. · 2004
- Device and method for repairing memory cell and memory system including the device36US 9,831,003 B2Samsung Electronics Co., Ltd. · 2017