User-enabled test mode patterns

An apparatus for operating a host system, comprising:

• processing circuitry associated with one or more memory devices and configured to cause the apparatus to:
• transmit, to a memory system, a command to transmit a plurality of test signals, the command comprising a first set of parameters associated with transmission of the plurality of test signals, wherein the first set of parameters comprise an indication of a first test mode pattern of a plurality of test mode patterns for transmission of the plurality of test signals and a first time duration associated with transmission of the plurality of test signals;
• receive, in accordance with transmitting the command, a message that indicates confirmation of the first set of parameters associated with transmission of the plurality of test signals;
• and
• receive, during the first time duration, the plurality of test signals in accordance with the first test mode pattern and with receiving the message.

A method for operating a memory system, comprising:

• receiving a command to transmit a plurality of test signals, the command comprising a first set of parameters associated with transmission of the plurality of test signals, wherein the first set of parameters comprise an indication of a first test mode pattern of a plurality of test mode patterns for transmission of the plurality of test signals and a first time duration associated with transmission of the plurality of test signals;
• transmitting, in accordance with receiving the command, a message that indicates confirmation of the first set of parameters associated with transmission of the plurality of test signals;
• and
• transmitting, during the first time duration, the plurality of test signals in accordance with the first test mode pattern and with transmitting the message.