G11C 29/12
Built-in arrangements for testing
Official title: Built-in arrangements for testing, e.g. built-in self testing [BIST] {or interconnection details}
G11C29/12 (Built-in arrangements for testing) appears on 11,681 US grants and 10,926 published applications in this corpus.
Search patents in G11C- Granted patents
- 11,681
- Published applications
- 10,926
- Assignees
- 1,106
- Inventors
- 14,115
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 6 | 0 |
| 1977 | 4 | 0 |
| 1978 | 4 | 0 |
| 1979 | 0 | 0 |
| 1980 | 2 | 0 |
| 1981 | 1 | 0 |
| 1982 | 10 | 0 |
| 1983 | 4 | 0 |
| 1984 | 11 | 0 |
| 1985 | 7 | 0 |
| 1986 | 15 | 0 |
| 1987 | 17 | 0 |
| 1988 | 29 | 0 |
| 1989 | 32 | 0 |
| 1990 | 29 | 0 |
| 1991 | 35 | 0 |
| 1992 | 38 | 0 |
| 1993 | 50 | 0 |
| 1994 | 57 | 0 |
| 1995 | 99 | 0 |
| 1996 | 118 | 0 |
| 1997 | 127 | 0 |
| 1998 | 184 | 0 |
| 1999 | 231 | 0 |
| 2000 | 160 | 0 |
| 2001 | 191 | 81 |
| 2002 | 237 | 232 |
| 2003 | 256 | 288 |
| 2004 | 253 | 374 |
| 2005 | 233 | 362 |
| 2006 | 315 | 373 |
| 2007 | 355 | 361 |
| 2008 | 321 | 381 |
| 2009 | 299 | 359 |
| 2010 | 349 | 260 |
| 2011 | 339 | 228 |
| 2012 | 248 | 248 |
| 2013 | 278 | 279 |
| 2014 | 342 | 390 |
| 2015 | 401 | 470 |
| 2016 | 469 | 466 |
| 2017 | 495 | 447 |
| 2018 | 428 | 441 |
| 2019 | 505 | 563 |
| 2020 | 627 | 622 |
| 2021 | 613 | 671 |
| 2022 | 655 | 794 |
| 2023 | 727 | 661 |
| 2024 | 658 | 616 |
| 2025 | 527 | 492 |
| 2026 | 290 | 467 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G11C 29/44Indication or identification of errors3,438
- G11C 29/18Address generation devices3,338
- G11C 29/38Response verification devices3,322
- G11C 2029/4402Internal storage of test result, quality data, chip identification, repair informationIndexing code1,601
- G11C 29/1201Comprising i/o circuitry1,275
- G11C 29/14Implementation of control logic1,251
- G11C 29/36Data generation devices904
- G11C 29/46Test trigger logic827
All 14 subgroupsShow fewer
- G11C 2029/1202Word line controlIndexing code809
- G11C 29/12005Comprising voltage or current generators807
- G11C 29/12015Comprising clock generation or timing circuitry724
- G11C 2029/1204Bit line controlIndexing code574
- G11C 2029/1208Error catch memoryIndexing code320
- G11C 2029/1206Location of test circuitry on chip or waferIndexing code174
Recent patents
- Memory, operation method thereof, and memory system6 Oct 2026US 12,755,801 B2Yangtze Memory Technologies Co., Ltd.
- Apparatuses and methods for read data preconditioning using a neural network6 Oct 2026US 12,755,804 B2Micron Technology, Inc.
- Memory device including error logging device and operating methods thereof6 Oct 2026US 12,755,805 B2SK hynix Inc.
- Logging a memory address associated with faulty usage-based disturbance data6 Oct 2026US 12,755,806 B2Micron Technology, Inc.
- Scannable SRAM29 Sep 2026US 12,749,528 B2SambaNova Systems, Inc.
- Self tuning for de-noising using multiple threshold-expert machine learning models8 Oct 2026US 2026/0310551 A1Samsung Electronics Co., Ltd.
- Optimization of soft bit windows based on signal and noise characteristics of memory cells8 Oct 2026US 2026/0311755 A1Micron Technology, Inc.
- Semiconductor memory device with processing-in-memory using test circuitry8 Oct 2026US 2026/0311790 A1Micron Technology, Inc.
- Self-calibration in a memory device8 Oct 2026US 2026/0311791 A1Micron Technology, Inc.
- Multiple input signature register circuit with pass-gate exclusive or logic8 Oct 2026US 2026/0311792 A1Micron Technology, Inc.
Most cited
By later US patents
- Three dimensional structure memory1,560US 5,915,167 AElm Technology Corporation · 1999
- Memory management system and method627US 8,200,887 B2Violin Memory, Inc. · 2012
- Flash eeprom system602US 5,297,148 ASunDisk Corporation · 1994
- Memory management system and method590US 9,189,334 B2Violin Memory, Inc. · 2015
- Memory management system and method586US 9,081,713 B1Violin Memory, Inc. · 2015