G11C 29/36
Data generation devices
Official title: Data generation devices, e.g. data inverters
G11C29/36 (Data generation devices) appears on 904 US grants and 888 published applications in this corpus.
Search patents in G11C- Granted patents
- 904
- Published applications
- 888
- Assignees
- 253
- Inventors
- 1,853
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 3 | 0 |
| 1988 | 3 | 0 |
| 1989 | 4 | 0 |
| 1990 | 3 | 0 |
| 1991 | 5 | 0 |
| 1992 | 1 | 0 |
| 1993 | 4 | 0 |
| 1994 | 3 | 0 |
| 1995 | 4 | 0 |
| 1996 | 7 | 0 |
| 1997 | 10 | 0 |
| 1998 | 18 | 0 |
| 1999 | 24 | 0 |
| 2000 | 16 | 0 |
| 2001 | 10 | 1 |
| 2002 | 12 | 10 |
| 2003 | 7 | 17 |
| 2004 | 12 | 23 |
| 2005 | 8 | 27 |
| 2006 | 21 | 40 |
| 2007 | 31 | 23 |
| 2008 | 27 | 30 |
| 2009 | 19 | 23 |
| 2010 | 26 | 16 |
| 2011 | 21 | 6 |
| 2012 | 15 | 16 |
| 2013 | 16 | 11 |
| 2014 | 10 | 19 |
| 2015 | 15 | 34 |
| 2016 | 27 | 33 |
| 2017 | 48 | 58 |
| 2018 | 42 | 55 |
| 2019 | 61 | 85 |
| 2020 | 67 | 42 |
| 2021 | 50 | 52 |
| 2022 | 61 | 72 |
| 2023 | 72 | 56 |
| 2024 | 51 | 50 |
| 2025 | 41 | 47 |
| 2026 | 27 | 42 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Memory, operation method thereof, and memory system6 Oct 2026US 12,755,801 B2Yangtze Memory Technologies Co., Ltd.
- Apparatuses and methods for read data preconditioning using a neural network6 Oct 2026US 12,755,804 B2Micron Technology, Inc.
- Logging a memory address associated with faulty usage-based disturbance data6 Oct 2026US 12,755,806 B2Micron Technology, Inc.
- Semiconductor system for detecting fail location29 Sep 2026US 12,749,551 B2SK hynix Inc.
- System and method for conducting built-in self-test of memory macro29 Sep 2026US 12,749,552 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Semiconductor memory device with processing-in-memory using test circuitry8 Oct 2026US 2026/0311790 A1Micron Technology, Inc.
- System and method for conducting built-in self-test of memory macro1 Oct 2026US 2026/0301839 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Voltage scaling based on error rate fluctuations1 Oct 2026US 2026/0301841 A1Micron Technology, Inc.
- Semiconductor memory devices and memory systems including the same27 Aug 2026US 2026/0253659 A1Samsung Elecronics Co., Ltd.
- Memory system and method for testing same20 Aug 2026US 2026/0245644 A1
Most cited
By later US patents
- Occupancy sensor and method of operating same328US 6,078,253 AMytech Corporation · 2000
- Occupancy sensor and method of operating same225US 6,415,205 B1Mytech Corporation · 2002
- Dynamic random access memory having decoding circuitry for partial memory blocks127US 5,901,105 A1999
- Memory selftest method and apparatus same102US 5,033,048 ADigital Equipment Corporation · 1991
- Apparatus and method for programmable built-in self-test and self-repair of embedded memory98US 6,560,740 B1Advanced Micro Devices, Inc. · 2003