G11C 2029/3602
Pattern generator
Official title: {Pattern generator}
G11C2029/3602 (Pattern generator) appears on 395 US grants and 440 published applications in this corpus.
Search patents in G11C- Granted patents
- 395
- Published applications
- 440
- Assignees
- 157
- Inventors
- 908
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2000 | 3 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 2 |
| 2004 | 5 | 19 |
| 2005 | 4 | 19 |
| 2006 | 11 | 32 |
| 2007 | 23 | 19 |
| 2008 | 23 | 26 |
| 2009 | 14 | 19 |
| 2010 | 22 | 13 |
| 2011 | 17 | 4 |
| 2012 | 13 | 7 |
| 2013 | 10 | 5 |
| 2014 | 4 | 4 |
| 2015 | 5 | 13 |
| 2016 | 9 | 7 |
| 2017 | 11 | 20 |
| 2018 | 13 | 24 |
| 2019 | 27 | 24 |
| 2020 | 23 | 22 |
| 2021 | 24 | 31 |
| 2022 | 31 | 36 |
| 2023 | 38 | 28 |
| 2024 | 29 | 24 |
| 2025 | 24 | 22 |
| 2026 | 11 | 20 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Memory device and memory testing22 Sep 2026US 12,744,100 B2Sigmastar Technology Ltd.
- Fault diagnostics16 Jun 2026US 12,657,365 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Semiconductor memory device with processing-in-memory using test circuitry16 Jun 2026US 12,658,273 B2Micron Technology, Inc.
- Memory system with redundant operation16 Jun 2026US 12,658,274 B2NXP USA, Inc.
- Method for performing aging test on semiconductor used for neural network16 Jun 2026US 12,658,280 B2Deepx Co., Ltd.
- Semiconductor memory device with processing-in-memory using test circuitry8 Oct 2026US 2026/0311790 A1Micron Technology, Inc.
- Semiconductor memory devices and memory systems including the same27 Aug 2026US 2026/0253659 A1Samsung Elecronics Co., Ltd.
- Memory system and method for testing same20 Aug 2026US 2026/0245644 A1
- Storage device and method of operating storage device20 Aug 2026US 2026/0245646 A1Samsung Electronics Co., Ltd.
- Memory built-in self-test having an adaptable access protocol23 Jul 2026US 2026/0212942 A1Google Inc.
Most cited
By later US patents
- Address sequencer within BIST (Built-in-Self-Test) system87US 7,010,736 B1Advanced Micro Devices, Inc. · 2006
- Content addressable memory with error signaling54US 7,257,763 B1NetLogic Microsystems, Inc. · 2007
- Memory integrity40US 9,213,653 B2Intel Corporation · 2015
- Parallel testing of a multiport memory31US 6,681,358 B1LSI Logic Corporation · 2004
- Semiconductor storage device and test system26US 6,823,485 B1Hitachi, Ltd. · 2004