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US 2026/0245644 A1Published application
Memory system and method for testing same
OwnerAkira YAMAGUCHIinventor
Life of this patent
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Abstract
A memory system includes a nonvolatile memory and a controller operatively coupled to the nonvolatile memory. The controller includes: a first input/output circuit configured to receive input of an access control signal for accessing the nonvolatile memory and a data control signal and output a signal based on data read from the nonvolatile memory; and a data control circuit configured to control data to be input to the nonvolatile memory and data to be output from the nonvolatile memory, based on the data control signal input from the first input/output circuit.
Claims20
A memory system comprising:
- a nonvolatile memory;
- and
- a controller operatively coupled to the nonvolatile memory, wherein
- the controller includes:
- a first input/output circuit configured to receive input of an access control signal for accessing the nonvolatile memory and a data control signal and output a signal based on data read from the nonvolatile memory;
- and
- a data control circuit configured to control data to be input to the nonvolatile memory and data to be output from the nonvolatile memory, based on the data control signal input from the first input/output circuit.
4 more elements
A method for testing a memory system, comprising:
- inputting a write command to a memory system according to an access control signal;
- inputting a data control signal to the memory system to input data to a nonvolatile memory in a controller;
- generating and inputting the input data to the nonvolatile memory;
- and
- causing the nonvolatile memory to execute writing of the input data.
2 more elements
Dependencies are inferred from the claim text.