G11C 2029/1202
Word line control
Official title: {Word line control}
G11C2029/1202 (Word line control) appears on 809 US grants and 864 published applications in this corpus.
Search patents in G11C- Granted patents
- 809
- Published applications
- 864
- Assignees
- 159
- Inventors
- 1,578
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 2 | 0 |
| 2000 | 1 | 0 |
| 2001 | 3 | 2 |
| 2002 | 2 | 1 |
| 2003 | 9 | 8 |
| 2004 | 9 | 7 |
| 2005 | 4 | 10 |
| 2006 | 12 | 14 |
| 2007 | 20 | 15 |
| 2008 | 7 | 20 |
| 2009 | 18 | 36 |
| 2010 | 23 | 18 |
| 2011 | 27 | 15 |
| 2012 | 14 | 19 |
| 2013 | 21 | 25 |
| 2014 | 29 | 22 |
| 2015 | 36 | 42 |
| 2016 | 45 | 38 |
| 2017 | 34 | 32 |
| 2018 | 34 | 24 |
| 2019 | 31 | 41 |
| 2020 | 49 | 56 |
| 2021 | 52 | 59 |
| 2022 | 59 | 84 |
| 2023 | 73 | 92 |
| 2024 | 85 | 81 |
| 2025 | 64 | 50 |
| 2026 | 43 | 53 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method, system and computer program product for memory repair22 Sep 2026US 12,744,103 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Wordline defect detection circuit, wordline defect detection method, and memory device including the same8 Sep 2026US 12,731,654 B2Samsung Electronics Co., Ltd.
- Wordline ramp rate monitor for early detection of defect activation1 Sep 2026US 12,725,672 B2Micron Technology, Inc.
- Storage apparatus including word line grouping device and operating method thereof25 Aug 2026US 12,718,894 B2SK hynix Inc.
- Wordline group-based identification of good memory blocks during a programming operation18 Aug 2026US 12,711,055 B2Micron Technology, Inc.
- Memory system and method of controlling memory system24 Sep 2026US 2026/0290462 A1Kioxia Corporation
- Semiconductor memory device17 Sep 2026US 2026/0279477 A1Kioxia Corporation
- Reducing partial block programming using dynamic trim settings10 Sep 2026US 2026/0268999 A1Micron Technology, Inc.
- Method for lut-free memory repair27 Aug 2026US 2026/0253660 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Memory device and operating method of the same6 Aug 2026US 2026/0229303 A1SK hynix Inc.
Most cited
By later US patents
- Semiconductor memory device212US 6,617,651 B2Kabushiki Kaisha Toshiba · 2003
- Three-dimensionally stacked nonvolatile semiconductor memory79US 7,983,084 B2Kabushiki Kaisha Toshiba · 2011
- Memory, memory system including the same and method for operating memory78US 9,123,447 B2SK hynix Inc. · 2015
- Integrated circuit memory array with fast test mode utilizing multiple word line selection and method therefor49US 6,768,685 B1Mtrix Semiconductor, Inc. · 2004
- Wafer level burn-in of memory integrated circuits47US 6,233,185 B1Micron Technology, Inc. · 2001