Method, system and computer program product for memory repair

A system, comprising:

• a memory testing device configured to perform at least one memory test on a memory block of a memory;
• and
• a processor coupled to the memory testing device,
• wherein the processor is configured to
• extract, from the at least one memory test, a location of at least one fail bit to be repaired in the memory block,
• obtain an available repair resource in the memory for repairing the memory block,
• determine, using first machine learning, whether the at least one fail bit is unrepairable according to
• the location of the at least one fail bit in the memory block, and
• the available repair resource, and
• in response to determining, using the first machine learning, that the at least one fail bit is not unrepairable, determine whether a Constraint Satisfaction Problem (CSP) containing a plurality of constraints is solvable, the plurality of constraints corresponding to
• the location of the at least one fail bit in the memory block, and
• the available repair resource,
• in response to determining that the CSP is not solvable, control the memory testing device to mark the memory block as unrepairable or to reject the memory, and
• in response to determining that the CSP is solvable, update a heuristic of the CSP using second machine learning separate from the first machine learning.

A computer program product, comprising a non-transitory, computer-readable medium containing therein instructions executable by a processor to cause the processor to

• extract a location of at least one fail bit to be repaired in a memory block of a memory,
• obtain an available repair resource in the memory for repairing the memory block,
• determine whether the at least one fail bit is repairable according to
• the location of the at least one fail bit in the memory block, and
• the available repair resource,
• in response to determining that the at least one fail bit is repairable, determine whether a remaining repair resource exists upon allocating at least a part of the available repair resource to repair the at least one fail bit, and
• in response to determining that the remaining repair resource exists, control a memory testing device to perform at least one memory test on the memory block by
• applying same test data to the memory block in multiple runs of the at least one memory test at corresponding different testing conditions, and
• determining a location of at least one weak bit in the memory block from results of the multiple runs of the at least one memory test.