G11C 29/46
Test trigger logic
G11C29/46 (Test trigger logic) appears on 827 US grants and 769 published applications in this corpus.
Search patents in G11C- Granted patents
- 827
- Published applications
- 769
- Assignees
- 171
- Inventors
- 1,361
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 2 | 0 |
| 1989 | 3 | 0 |
| 1990 | 3 | 0 |
| 1991 | 7 | 0 |
| 1992 | 10 | 0 |
| 1993 | 8 | 0 |
| 1994 | 11 | 0 |
| 1995 | 16 | 0 |
| 1996 | 16 | 0 |
| 1997 | 19 | 0 |
| 1998 | 29 | 0 |
| 1999 | 30 | 0 |
| 2000 | 12 | 0 |
| 2001 | 23 | 12 |
| 2002 | 20 | 25 |
| 2003 | 23 | 28 |
| 2004 | 22 | 19 |
| 2005 | 18 | 19 |
| 2006 | 19 | 26 |
| 2007 | 13 | 17 |
| 2008 | 16 | 14 |
| 2009 | 14 | 8 |
| 2010 | 9 | 11 |
| 2011 | 15 | 8 |
| 2012 | 9 | 11 |
| 2013 | 12 | 7 |
| 2014 | 12 | 12 |
| 2015 | 10 | 10 |
| 2016 | 12 | 13 |
| 2017 | 20 | 27 |
| 2018 | 28 | 33 |
| 2019 | 29 | 45 |
| 2020 | 48 | 41 |
| 2021 | 47 | 49 |
| 2022 | 45 | 57 |
| 2023 | 69 | 62 |
| 2024 | 53 | 56 |
| 2025 | 41 | 36 |
| 2026 | 28 | 123 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Memory controller capable of performing multiple operations, an operation method thereof, a memory device, and a memory system29 Sep 2026US 12,749,553 B2Samsung Electronics Co., Ltd.
- Interrupting a memory built-in self-test15 Sep 2026US 12,738,338 B2Micron Technology, Inc.
- Proactive history read adaptation without test read1 Sep 2026US 12,725,673 B2SK hynix Inc.
- Die level failure recovery1 Sep 2026US 12,725,674 B2SanDisk Technologies LLC
- Memory device and method for calibrating impedance thereof4 Aug 2026US 12,700,470 B2Samsung Electronics Co., Ltd.
- Multiple input signature register circuit with pass-gate exclusive or logic8 Oct 2026US 2026/0311792 A1Micron Technology, Inc.
- Clock generation circuits for memory devices with built-in self test1 Oct 2026US 2026/0301838 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Handling power-loss reset events with bad block risk mitigation1 Oct 2026US 2026/0301840 A1Micron Technology, Inc.
- Memory controller capable of performing multiple operations, an operation method thereof, a memory device, and a memory system1 Oct 2026US 2026/0301842 A1Samsung Electronics Co., Ltd.
- Reducing partial block programming using dynamic trim settings10 Sep 2026US 2026/0268999 A1Micron Technology, Inc.
Most cited
By later US patents
- Memory system having programmable control parameters235US 5,801,985 AMicron Technology, Inc. · 1998
- Systems and methods for protecting access to encrypted information146US 6,272,637 B1Dallas Semiconductor Corporation · 2001
- Memory system having non-volatile data storage structure for memory control parameters and method125US 5,627,784 AMicron Quantum Devices, Inc. · 1997
- Semiconductor memory system for flash memory107US 7,571,277 B2Hitachi, Ltd. · 2009
- Memory system with non-volatile data storage unit and method of initializing same105US 5,615,159 AMicron Quantum Devices, Inc. · 1997