Handling power-loss reset events with bad block risk mitigation

At least one non-transitory machine-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:

• detecting that a power-loss reset (PLRESET) low event has occurred on a memory die of a memory device operatively coupled to the processing device, the PLRESET low event comprising the memory die aborting an ongoing memory operation in response to a supply voltage to the memory die dropping below a threshold voltage value;
• and in response to detecting that the PLRESET low event occurred on the memory die:
• retiring the memory die;
• causing the memory die to be reinitialized when the memory device is next powered up;
• and using an error-correction technique supported by the memory device to recover data stored on the memory die.

A method comprising:

• issuing, by a host system to a memory sub-system, an access request that initiates a memory operation on a memory die of a memory device of the memory sub-system, the memory sub-system comprising a processing device, operatively coupled to the memory device, programmed to cause the memory sub-system to perform operations comprising:
• detecting that a power-loss reset (PLRESET) low event has occurred on the memory die, the PLRESET low event comprising the memory die aborting the memory operation in response to a supply voltage to the memory die dropping below a threshold voltage value;
• and in response to detecting that the PLRESET low event occurred on the memory die:
• retiring the memory die;
• causing the memory die to be reinitialized when the memory device is next powered up;
• and using an error-correction technique supported by the memory device to recover data stored on the memory die;
• and accessing, by the host system from the memory sub-system, the data recovered using the error-correction technique.