G11C 2029/4402
Internal storage of test result, quality data, chip identification, repair information
Official title: {Internal storage of test result, quality data, chip identification, repair information}
G11C2029/4402 (Internal storage of test result, quality data, chip identification, repair information) appears on 1,601 US grants and 1,679 published applications in this corpus.
Search patents in G11C- Granted patents
- 1,601
- Published applications
- 1,679
- Assignees
- 305
- Inventors
- 2,718
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 4 | 0 |
| 1998 | 3 | 0 |
| 1999 | 7 | 0 |
| 2000 | 4 | 0 |
| 2001 | 6 | 2 |
| 2002 | 8 | 10 |
| 2003 | 5 | 11 |
| 2004 | 12 | 37 |
| 2005 | 13 | 36 |
| 2006 | 34 | 53 |
| 2007 | 32 | 37 |
| 2008 | 27 | 33 |
| 2009 | 24 | 31 |
| 2010 | 42 | 31 |
| 2011 | 29 | 25 |
| 2012 | 28 | 37 |
| 2013 | 42 | 49 |
| 2014 | 69 | 90 |
| 2015 | 101 | 125 |
| 2016 | 101 | 87 |
| 2017 | 109 | 99 |
| 2018 | 92 | 108 |
| 2019 | 116 | 107 |
| 2020 | 111 | 119 |
| 2021 | 120 | 128 |
| 2022 | 130 | 126 |
| 2023 | 120 | 91 |
| 2024 | 99 | 99 |
| 2025 | 76 | 57 |
| 2026 | 33 | 51 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Storage apparatus including word line grouping device and operating method thereof25 Aug 2026US 12,718,894 B2SK hynix Inc.
- Flash memory architecture implementing interconnection redundancy18 Aug 2026US 12,711,028 B2
- Non-volatile memory device, storage device including the same device, and method of operating the same storage device18 Aug 2026US 12,711,999 B2Samsung Electronics Co., Ltd.
- Apparatuses and methods for separate write enable for single-pass access of data, metadata, and parity information18 Aug 2026US 12,712,047 B2Micron Technology, Inc.
- Memory devices using defective address information processing circuits, and operating methods, and memory systems thereof18 Aug 2026US 12,712,049 B2Yangtze Memory Technologies Co., Ltd.
- Apparatuses and methods for identifying memory devices of a semiconductor device sharing an external resistance24 Sep 2026US 2026/0291501 A1Lodestar Licensing Group LLC
- Method for lut-free memory repair27 Aug 2026US 2026/0253660 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Method, system, device, and storage medium for determining wck-on value of lpddr chip30 Jul 2026US 2026/0221212 A1Shenzhen Rayson Technology Co., Ltd.
- In-memory repair information for a row subset23 Jul 2026US 2026/0211772 A1QUALCOMM Incorporated
- Storage device and operating method thereof9 Jul 2026US 2026/0196284 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Method circuit and system for read error detection in a non-volatile memory array317US 6,992,932 B2Saifun Semiconductors Ltd. · 2006
- Memory system having programmable control parameters235US 5,801,985 AMicron Technology, Inc. · 1998
- Background selection of voltage reference values for performing memory read operations207US 8,638,602 B1Western Digital Technologies, Inc. · 2014
- Circuit and method for on-board programming of PRD Serial EEPROMS146US 5,661,677 AMicron Electronics, Inc. · 1997
- Memory expansion module with stacked memory packages and a serial storage unit146US 6,683,372 B1Sun Microsystems, Inc. · 2004