G11C 2029/1208
Error catch memory
Official title: {Error catch memory}
G11C2029/1208 (Error catch memory) appears on 320 US grants and 307 published applications in this corpus.
Search patents in G11C- Granted patents
- 320
- Published applications
- 307
- Assignees
- 123
- Inventors
- 683
- Latest grant
- 24 Feb 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1999 | 2 | 0 |
| 2000 | 5 | 0 |
| 2001 | 8 | 3 |
| 2002 | 9 | 8 |
| 2003 | 14 | 21 |
| 2004 | 18 | 25 |
| 2005 | 15 | 28 |
| 2006 | 19 | 18 |
| 2007 | 19 | 18 |
| 2008 | 15 | 17 |
| 2009 | 14 | 18 |
| 2010 | 28 | 21 |
| 2011 | 16 | 7 |
| 2012 | 12 | 8 |
| 2013 | 12 | 4 |
| 2014 | 6 | 5 |
| 2015 | 7 | 10 |
| 2016 | 8 | 3 |
| 2017 | 10 | 18 |
| 2018 | 11 | 14 |
| 2019 | 15 | 8 |
| 2020 | 9 | 11 |
| 2021 | 6 | 10 |
| 2022 | 16 | 11 |
| 2023 | 10 | 5 |
| 2024 | 9 | 7 |
| 2025 | 6 | 3 |
| 2026 | 1 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Testing method and testing system24 Feb 2026US 12,562,235 B2Powerchip Semiconductor Manufacturing Corporation
- Testing parity and ECC logic using MBIST16 Dec 2025US 12,499,959 B2Advanced Micro Devices, Inc.
- Memory verification using processing-in-memory4 Nov 2025US 12,462,889 B2Advanced Micro Devices, Inc.
- Control circuit, memory system and control method23 Sep 2025US 12,424,298 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Memory device for outputting test results16 Sep 2025US 12,417,813 B2Samsung Electronics Co., Ltd.
- Repair Sharing In Serial Repair Interfaces25 Jun 2026US 2026/0179710 A1Google Inc.
- Interconnect repair systems and methods for integrated circuits5 Mar 2026US 2026/0064620 A1Avago Technologies International Sales Pte. Limited
- Memory built-in-self-test (mbist) with enhanced fault indicators22 Jan 2026US 2026/0024606 A1NXP USA, Inc.
- Memory built-in-self-test (mbist) with enhanced fault counter22 Jan 2026US 2026/0024607 A1NXP USA, Inc.
- Techniques for detecting a state of a bus15 Jan 2026US 2026/0018230 A1Micron Technology, Inc.
Most cited
By later US patents
- Redundancy analysis for embedded memories with built-in self test and built-in self repair308US 6,067,262 ALSI Logic Corporation · 2000
- Multi-chip package having repairable embedded memories on a system chip with an EEPROM chip storing repair information161US 7,053,470 B1Azul Systems, Inc. · 2006
- Memory module, test system and method for testing one or a plurality of memory modules145US 7,231,562 B2Infineon Technologies AG · 2007
- Error detection, documentation, and correction in a flash memory device125US 7,203,874 B2Micron Technology, Inc. · 2007
- Fuseless memory repair system and method of operation121US 6,011,734 AMotorola, Inc. · 2000