G11C 29/14
Implementation of control logic
Official title: Implementation of control logic, e.g. test mode decoders
G11C29/14 (Implementation of control logic) appears on 1,251 US grants and 1,148 published applications in this corpus.
Search patents in G11C- Granted patents
- 1,251
- Published applications
- 1,148
- Assignees
- 265
- Inventors
- 2,343
- Latest grant
- 23 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 4 | 0 |
| 1987 | 0 | 0 |
| 1988 | 2 | 0 |
| 1989 | 2 | 0 |
| 1990 | 1 | 0 |
| 1991 | 2 | 0 |
| 1992 | 6 | 0 |
| 1993 | 2 | 0 |
| 1994 | 3 | 0 |
| 1995 | 7 | 0 |
| 1996 | 10 | 0 |
| 1997 | 18 | 0 |
| 1998 | 15 | 0 |
| 1999 | 17 | 0 |
| 2000 | 13 | 0 |
| 2001 | 25 | 12 |
| 2002 | 42 | 38 |
| 2003 | 42 | 43 |
| 2004 | 33 | 55 |
| 2005 | 36 | 44 |
| 2006 | 45 | 59 |
| 2007 | 59 | 40 |
| 2008 | 51 | 62 |
| 2009 | 38 | 41 |
| 2010 | 60 | 31 |
| 2011 | 49 | 13 |
| 2012 | 24 | 31 |
| 2013 | 23 | 20 |
| 2014 | 23 | 33 |
| 2015 | 25 | 17 |
| 2016 | 25 | 21 |
| 2017 | 22 | 27 |
| 2018 | 26 | 30 |
| 2019 | 40 | 45 |
| 2020 | 54 | 64 |
| 2021 | 76 | 103 |
| 2022 | 95 | 116 |
| 2023 | 106 | 70 |
| 2024 | 48 | 49 |
| 2025 | 55 | 42 |
| 2026 | 24 | 42 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Optimization of soft bit windows based on signal and noise characteristics of memory cells23 Jun 2026US 12,665,022 B2Micron Technology, Inc.
- Semiconductor memory device with processing-in-memory using test circuitry16 Jun 2026US 12,658,273 B2Micron Technology, Inc.
- Memory system with redundant operation16 Jun 2026US 12,658,274 B2NXP USA, Inc.
- Method for performing aging test on semiconductor used for neural network16 Jun 2026US 12,658,280 B2Deepx Co., Ltd.
- Semiconductor device with selective command delay and associated methods and systems9 Jun 2026US 12,651,639 B2
- Optimization of soft bit windows based on signal and noise characteristics of memory cells8 Oct 2026US 2026/0311755 A1Micron Technology, Inc.
- Semiconductor memory devices and memory systems including the same27 Aug 2026US 2026/0253659 A1Samsung Elecronics Co., Ltd.
- Method for lut-free memory repair27 Aug 2026US 2026/0253660 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Testing adapters, testing systems, and testing methods for memory apparatus13 Aug 2026US 2026/0237449 A1Yangtze Memory Technologies Co., Ltd.
- Input/output circuit for memory and operating method thereof6 Aug 2026US 2026/0229304 A1Taiwan Semiconductor Manufacturing Company.Ltd
Most cited
By later US patents
- Occupancy sensor and method of operating same328US 6,078,253 AMytech Corporation · 2000
- Occupancy sensor and method of operating same225US 6,415,205 B1Mytech Corporation · 2002
- Built-in self test for integrated circuit memory212US 5,138,619 ANational Semiconductor Corporation · 1992
- Built-in self test for integrated circuits189US 5,173,906 A1992
- Semiconductor integrated circuit capable of testing and substituting defective memories and method thereof152US 6,246,618 B1Mitsubishi Denki Kabushiki Kaisha · 2001