G11C 29/12005
Comprising voltage or current generators
Official title: {comprising voltage or current generators}
G11C29/12005 (Comprising voltage or current generators) appears on 807 US grants and 863 published applications in this corpus.
Search patents in G11C- Granted patents
- 807
- Published applications
- 863
- Assignees
- 174
- Inventors
- 1,659
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 3 | 0 |
| 2000 | 3 | 0 |
| 2001 | 4 | 5 |
| 2002 | 11 | 14 |
| 2003 | 15 | 26 |
| 2004 | 34 | 32 |
| 2005 | 24 | 30 |
| 2006 | 26 | 19 |
| 2007 | 21 | 40 |
| 2008 | 21 | 31 |
| 2009 | 30 | 28 |
| 2010 | 33 | 18 |
| 2011 | 23 | 23 |
| 2012 | 18 | 14 |
| 2013 | 12 | 15 |
| 2014 | 18 | 15 |
| 2015 | 16 | 12 |
| 2016 | 21 | 18 |
| 2017 | 29 | 29 |
| 2018 | 21 | 32 |
| 2019 | 36 | 24 |
| 2020 | 32 | 30 |
| 2021 | 41 | 48 |
| 2022 | 71 | 104 |
| 2023 | 74 | 75 |
| 2024 | 70 | 59 |
| 2025 | 55 | 56 |
| 2026 | 41 | 66 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Using built-in self test or test results to identify weak memory bits and enable assist circuits when necessary22 Sep 2026US 12,744,098 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Adaptive DSP generation of read thresholds for gaussian and non-gaussian distributions in solid state storage using cumulative observed counts22 Sep 2026US 12,744,101 B2Nanjing Tenafe Electronic Technology Co., Ltd.
- Semiconductor memory device, controller, memory system and method of operating the same22 Sep 2026US 12,744,102 B2SK hynix Inc.
- Wordline defect detection circuit, wordline defect detection method, and memory device including the same8 Sep 2026US 12,731,654 B2Samsung Electronics Co., Ltd.
- Wordline ramp rate monitor for early detection of defect activation1 Sep 2026US 12,725,672 B2Micron Technology, Inc.
- Self tuning for de-noising using multiple threshold-expert machine learning models8 Oct 2026US 2026/0310551 A1Samsung Electronics Co., Ltd.
- Optimization of soft bit windows based on signal and noise characteristics of memory cells8 Oct 2026US 2026/0311755 A1Micron Technology, Inc.
- Self-calibration in a memory device8 Oct 2026US 2026/0311791 A1Micron Technology, Inc.
- Failure bits detection circuit, failure bits detection circuit method, and memory device1 Oct 2026US 2026/0301837 A1Macronix International Co., Ltd.
- Memory system and method of controlling memory system24 Sep 2026US 2026/0290462 A1Kioxia Corporation
Most cited
By later US patents
- Reference current generator, and method of programming, adjusting and/or operating same161US 6,912,150 B22005
- Address sequencer within BIST (Built-in-Self-Test) system87US 7,010,736 B1Advanced Micro Devices, Inc. · 2006
- Semiconductor integrated circuit device and method of testing the same65US 6,055,655 AKabushiki Kaisha Toshiba · 2000
- Method and apparatus for stress testing integrated circuits using an adjustable AC hot carrier injection source60US 6,815,971 B2Taiwan Semiconductor Manufacturing Company.Ltd · 2004
- Internally asymmetric methods and circuits for evaluating static memory cell dynamic stability59US 7,301,835 B2International Business Machines Corporation · 2007