G03F 9/7042
Alignment for lithographic apparatus using patterning methods other than those involving the
Official title: {Alignment for lithographic apparatus using patterning methods other than those involving the exposure to radiation, e.g. by stamping or imprinting (non-exposure lithographic processes per se G03F7/0002)}
G03F9/7042 (Alignment for lithographic apparatus using patterning methods other than those involving the) appears on 235 US grants and 300 published applications in this corpus.
Search patents in G03F- Granted patents
- 235
- Published applications
- 300
- Assignees
- 47
- Inventors
- 398
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 1 |
| 2003 | 1 | 1 |
| 2004 | 0 | 1 |
| 2005 | 2 | 0 |
| 2006 | 0 | 9 |
| 2007 | 2 | 14 |
| 2008 | 2 | 7 |
| 2009 | 4 | 7 |
| 2010 | 6 | 9 |
| 2011 | 10 | 9 |
| 2012 | 4 | 10 |
| 2013 | 3 | 10 |
| 2014 | 8 | 4 |
| 2015 | 5 | 13 |
| 2016 | 6 | 21 |
| 2017 | 10 | 20 |
| 2018 | 19 | 21 |
| 2019 | 21 | 22 |
| 2020 | 25 | 19 |
| 2021 | 17 | 23 |
| 2022 | 15 | 15 |
| 2023 | 26 | 22 |
| 2024 | 12 | 18 |
| 2025 | 20 | 11 |
| 2026 | 14 | 13 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Pattern forming method, semiconductor device manufacturing method, and template6 Oct 2026US 12,754,487 B2Kioxia Corporation
- Management apparatus, lithography apparatus. management method, and article manufacturing method15 Sep 2026US 12,736,928 B2Canon Kabushiki Kaisha
- Managing multi-objective alignments for imprinting25 Aug 2026US 12,715,171 B2Magic Leap, Inc.
- Imprint apparatus and article manufacturing method11 Aug 2026US 12,703,140 B2Canon Kabushiki Kaisha
- Imprinting method, imprint apparatus and article manufacturing method11 Aug 2026US 12,704,794 B2Canon Kabushiki Kaisha
- System and Process for Imprinting8 Oct 2026US 2026/0310071 A1Morphotonics Holding B.V.
- Nanoimprint lithography mold and nanoimprint lithography using same8 Oct 2026US 2026/0310109 A1Taiwan Semiconductor Manufacturing Company.Ltd
- System and Process for Imprinting1 Oct 2026US 2026/0299444 A1Morphotonics Holding B.V.
- Mark detection method, mark detection apparatus, pattern formation apparatus, and article manufacturing method1 Oct 2026US 2026/0305247 A1Canon Kabushiki Kaisha
- Scalable nanoimprint manufacturing of functional multi-layer metasurface devices24 Sep 2026US 2026/0287787 A1Arizona Board of Regents on behalf of Arizona State University
Most cited
By later US patents
- Stamp for a lithographic process159US 5,817,242 AInternational Business Machines.Corp · 1998
- Wafer level creation of multiple optical elements72US 6,844,978 B2Digital Optics Corporation · 2005
- Method of dicing wafer level integrated multiple optical elements62US 6,096,155 ADigital Optics Corporation · 2000
- Scanning probe based lithographic alignment33US 6,955,767 B2Hewlett-Packard Development Company, L. P. · 2005
- Method and apparatus for direct referencing of top surface of workpiece during imprint lithography33US 7,883,832 B2International Business Machines Corporation · 2011