G01R 31/318558
Addressing or selecting of subparts of the device under test
Official title: {Addressing or selecting of subparts of the device under test}
G01R31/318558 (Addressing or selecting of subparts of the device under test) appears on 842 US grants and 675 published applications in this corpus.
Search patents in G01R- Granted patents
- 842
- Published applications
- 675
- Assignees
- 202
- Inventors
- 1,154
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 2 | 0 |
| 1986 | 4 | 0 |
| 1987 | 8 | 0 |
| 1988 | 2 | 0 |
| 1989 | 8 | 0 |
| 1990 | 8 | 0 |
| 1991 | 7 | 0 |
| 1992 | 12 | 0 |
| 1993 | 8 | 0 |
| 1994 | 9 | 0 |
| 1995 | 12 | 0 |
| 1996 | 14 | 0 |
| 1997 | 14 | 0 |
| 1998 | 13 | 0 |
| 1999 | 14 | 0 |
| 2000 | 9 | 0 |
| 2001 | 11 | 1 |
| 2002 | 15 | 19 |
| 2003 | 19 | 25 |
| 2004 | 24 | 30 |
| 2005 | 17 | 35 |
| 2006 | 22 | 14 |
| 2007 | 28 | 26 |
| 2008 | 29 | 26 |
| 2009 | 25 | 28 |
| 2010 | 33 | 44 |
| 2011 | 47 | 44 |
| 2012 | 36 | 29 |
| 2013 | 36 | 38 |
| 2014 | 42 | 39 |
| 2015 | 43 | 39 |
| 2016 | 41 | 41 |
| 2017 | 37 | 31 |
| 2018 | 30 | 24 |
| 2019 | 31 | 24 |
| 2020 | 16 | 20 |
| 2021 | 25 | 23 |
| 2022 | 20 | 11 |
| 2023 | 28 | 19 |
| 2024 | 14 | 14 |
| 2025 | 17 | 23 |
| 2026 | 11 | 8 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- System and method for controlling at-speed testing of integrated circuits25 Aug 2026US 12,716,942 B2NXP B. V.
- Interface to full and reduced pin JTAG devices9 Jun 2026US 12,650,466 B2Texas Instruments Incorporated
- Streaming scan network latency balancing to reduce cost of testing identical replicated blocks2 Jun 2026US 12,645,623 B2QUALCOMM Incorporated
- High-throughput scan architecture26 May 2026US 12,638,503 B2Google Inc.
- Modular scan data network for high speed scan data transfer21 Apr 2026US 12,607,673 B2QUALCOMM Incorporated
- Testing large-scale electronic systems constituted of many functional blocks1 Oct 2026US 2026/0299023 A1Krivya Semicon Private Limited
- Test network reset circuits2 Jul 2026US 2026/0186055 A1Intel Corporation
- Scan chain control2 Jul 2026US 2026/0186056 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Hardware decoder for run-length encoded mask bits for in-system automatic test pattern generation (atpg)28 May 2026US 2026/0147040 A1QUALCOMM Incorporated
- Scan chain segmentation for an integrated circuit21 May 2026US 2026/0140177 A1QUALCOMM Incorporated
Most cited
By later US patents
- Emulation devices, systems and methods utilizing state machines263US 5,329,471 ATexas Instruments Incorporated · 1994
- Serial scan chain architecture for a data processing system and method of operation173US 5,592,493 AMotorola, Inc. · 1997
- Method of designing circuit having multiple test access ports, circuit produced thereby and method of using same144US 6,829,730 B2LogicVision, Inc. · 2004
- Addressable shadow port and protocol for serial bus networks133US 5,483,518 ATexas Instruments Incorporated · 1996
- Method and apparatus for optimized parallel testing and access of electronic circuits113US 6,988,232 B2Intellitech Corporation · 2006