Scan chain segmentation for an integrated circuit
AssigneeQUALCOMM Incorporated
InventorsRajesh Kumar Tiwari, Yogesh Yadav, Srinivas Patil, Mohammed Zuber P Malek
Life of this patent
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Abstract
An apparatus includes a test controller and a scan chain coupled to the test controller. The scan chain includes a first segment and a second segment. The apparatus further includes circuitry coupled to the test controller and the scan chain. The circuitry is configured to provide, to the second segment, an output of the first segment in connection with a first test. The circuitry is further configured to provide, to the second segment, a test pattern in connection with a second test.
Claims20
An apparatus comprising:
- a test controller;
- a scan chain coupled to the test controller, the scan chain including a first segment and a second segment;
- and
- circuitry coupled to the test controller and the scan chain, the circuitry configured to provide, to the second segment, an output of the first segment in connection with a first test, the circuitry further configured to provide, to the second segment, a test pattern in connection with a second test.
A method comprising:
- initiating a test associated with a scan chain of an integrated circuit, the scan chain including a first segment and a second segment;
- during the test, selecting, as an input to the second segment, one of an output of the first segment or a test pattern that is input to the first segment;
- and
- receiving a test result associated with the scan chain, the test result based on the selected input to the second segment.
A non-transitory computer-readable medium storing instructions executable by one or more processors to perform one or more operations, the one or more operations comprising:
- initiating a test associated with a scan chain of an integrated circuit, the scan chain including a first segment and a second segment;
- during the test, selecting, as an input to the second segment, one of an output of the first segment or a test pattern that is input to the first segment;
- and
- receiving a test result associated with the scan chain, the test result based on the selected input to the second segment.
Dependencies are inferred from the claim text.