G01R 31/318555
Control logic
Official title: {Control logic}
G01R31/318555 (Control logic) appears on 897 US grants and 773 published applications in this corpus.
Search patents in G01R- Granted patents
- 897
- Published applications
- 773
- Assignees
- 208
- Inventors
- 1,095
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 2 | 0 |
| 1983 | 0 | 0 |
| 1984 | 3 | 0 |
| 1985 | 2 | 0 |
| 1986 | 1 | 0 |
| 1987 | 2 | 0 |
| 1988 | 2 | 0 |
| 1989 | 3 | 0 |
| 1990 | 2 | 0 |
| 1991 | 5 | 0 |
| 1992 | 5 | 0 |
| 1993 | 4 | 0 |
| 1994 | 5 | 0 |
| 1995 | 12 | 0 |
| 1996 | 9 | 0 |
| 1997 | 9 | 0 |
| 1998 | 13 | 0 |
| 1999 | 12 | 0 |
| 2000 | 12 | 0 |
| 2001 | 9 | 5 |
| 2002 | 14 | 26 |
| 2003 | 23 | 27 |
| 2004 | 29 | 38 |
| 2005 | 26 | 35 |
| 2006 | 35 | 31 |
| 2007 | 33 | 33 |
| 2008 | 38 | 31 |
| 2009 | 37 | 31 |
| 2010 | 41 | 38 |
| 2011 | 46 | 43 |
| 2012 | 42 | 32 |
| 2013 | 33 | 51 |
| 2014 | 40 | 45 |
| 2015 | 51 | 36 |
| 2016 | 36 | 30 |
| 2017 | 29 | 36 |
| 2018 | 30 | 27 |
| 2019 | 34 | 23 |
| 2020 | 21 | 20 |
| 2021 | 29 | 27 |
| 2022 | 22 | 24 |
| 2023 | 39 | 32 |
| 2024 | 27 | 21 |
| 2025 | 18 | 19 |
| 2026 | 12 | 12 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Chip testing method and apparatus15 Sep 2026US 12,736,583 B2Xiamen Industrial Technology Research Institute Co., Ltd.
- Addressable test access port4 Aug 2026US 12,699,134 B2Texas Instruments Incorporated
- Wrapper cell design and built-in self-test architecture for 3DIC test and diagnosis21 Jul 2026US 12,687,578 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Integrated circuit with multiplexer for testing16 Jun 2026US 12,656,397 B2Samsung Electronics Co., Ltd.
- Streaming scan network latency balancing to reduce cost of testing identical replicated blocks2 Jun 2026US 12,645,623 B2QUALCOMM Incorporated
- Wrapper Cell Design and Built-In Self-Test Architecture for 3DIC Test and Diagnosis8 Oct 2026US 2026/0309778 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Scan Flip-Flops With Pre-Setting Combinational Logic13 Aug 2026US 2026/0235676 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Test network reset circuits2 Jul 2026US 2026/0186055 A1Intel Corporation
- Scan chain control2 Jul 2026US 2026/0186056 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Test device for performing test on combinational logic circuit, and method of operating the test device18 Jun 2026US 2026/0169066 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Microprocessor with an external command mode for diagnosis and debugging197US 5,479,652 AIntel Corporation · 1995
- Test systems for obtaining a sample-on-the-fly event trace for an integrated circuit with an integrated debug trigger apparatus and an external pulse pin152US 5,771,240 AHewlett-Packard Company · 1998
- Method of designing circuit having multiple test access ports, circuit produced thereby and method of using same144US 6,829,730 B2LogicVision, Inc. · 2004
- Method and apparatus for interrogating electronic equipment components133US 8,829,934 B2Scanimetrics Inc. · 2014
- Method and apparatus for optimized parallel testing and access of electronic circuits113US 6,988,232 B2Intellitech Corporation · 2006