Test device for performing test on combinational logic circuit, and method of operating the test device

A method of operating a test device for performing a scan test on a combinational logic circuit configured to be in electrical communication with an analog circuit, the method comprising:

• inputting an input pattern to the combinational logic circuit;
• obtaining a first output value output from a first output node of the combinational logic circuit;
• determining whether a short current occurs in the analog circuit, by inputting the first output value into the analog circuit;
• and
• connecting a first cell circuit corresponding to the first output value between the first output node and the analog circuit based on a determination that the short current does not occur in the analog circuit,
• wherein the first cell circuit is configured to output the first output value based on a scan signal.

An integrated circuit comprising:

• a combinational logic circuit;
• an analog circuit configured to be in electrical communication with one or more output nodes of the combinational logic circuit, wherein the one or more output nodes of the combinational logic circuit comprise a first output node;
• and
• a test device configured to test the combinational logic circuit based on a scan signal,
• wherein the test device is configured to:
• input an input pattern to the combinational logic circuit;
• obtain a first output value output from the first output node of the combinational logic circuit;
• determine whether a short current occurs in the analog circuit, by inputting the first output value into the analog circuit;
• and
• connect a first cell circuit corresponding to the first output value between the first output node and the analog circuit based on a determination that the short current does not occur,
• wherein the first cell circuit comprises at least one logic element and is configured to output the first output value based on the scan signal.