Method and apparatus for interrogating electronic equipment components

An apparatus for interrogating an electronic circuit supported by a substrate, comprising:

• a tester positioned external and spaced from the substrate and comprising a tester transceiver;
• a testing circuit supported by the substrate and connected to the electronic circuit, the testing circuit comprising a processor and a testing circuit transceiver;
• the testing circuit transceiver communicating with the tester transceiver for transmitting instructions from the tester to the processor and for transmitting results of an interrogation of the electronic circuit from the processor to the tester;
• the processor and the testing circuit transceiver being separate and distinct from the electronic circuit to be interrogated:
• and
• the processor being programmed to process instructions from the tester to interrogate the electronic circuit with the interrogation corresponding to the instructions.