G01R 31/318547
Data generators or compressors
Official title: {Data generators or compressors}
G01R31/318547 (Data generators or compressors) appears on 594 US grants and 496 published applications in this corpus.
Search patents in G01R- Granted patents
- 594
- Published applications
- 496
- Assignees
- 165
- Inventors
- 773
- Latest grant
- 21 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 4 | 0 |
| 1986 | 4 | 0 |
| 1987 | 4 | 0 |
| 1988 | 4 | 0 |
| 1989 | 1 | 0 |
| 1990 | 5 | 0 |
| 1991 | 0 | 0 |
| 1992 | 2 | 0 |
| 1993 | 3 | 0 |
| 1994 | 4 | 0 |
| 1995 | 13 | 0 |
| 1996 | 6 | 0 |
| 1997 | 5 | 0 |
| 1998 | 7 | 0 |
| 1999 | 4 | 0 |
| 2000 | 4 | 0 |
| 2001 | 4 | 0 |
| 2002 | 4 | 10 |
| 2003 | 12 | 23 |
| 2004 | 11 | 14 |
| 2005 | 14 | 28 |
| 2006 | 15 | 30 |
| 2007 | 34 | 30 |
| 2008 | 22 | 32 |
| 2009 | 27 | 25 |
| 2010 | 36 | 26 |
| 2011 | 33 | 24 |
| 2012 | 23 | 15 |
| 2013 | 24 | 19 |
| 2014 | 20 | 28 |
| 2015 | 26 | 26 |
| 2016 | 32 | 22 |
| 2017 | 28 | 19 |
| 2018 | 25 | 27 |
| 2019 | 30 | 13 |
| 2020 | 18 | 11 |
| 2021 | 20 | 17 |
| 2022 | 18 | 13 |
| 2023 | 17 | 12 |
| 2024 | 15 | 18 |
| 2025 | 9 | 8 |
| 2026 | 6 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Wrapper cell design and built-in self-test architecture for 3DIC test and diagnosis21 Jul 2026US 12,687,578 B2Taiwan Semiconductor Manufacturing Company.Ltd
- High-throughput scan architecture26 May 2026US 12,638,503 B2Google Inc.
- Methods and apparatus to identify faults in processors12 May 2026US 12,625,179 B2Texas Instruments Incorporated
- Providing configurable security for intellectual property circuits of a processor14 Apr 2026US 12,601,785 B2Intel Corporation
- X-masking for in-system deterministic test7 Apr 2026US 12,596,150 B2Siemens Industry Software Inc.
- Wrapper Cell Design and Built-In Self-Test Architecture for 3DIC Test and Diagnosis8 Oct 2026US 2026/0309778 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Semiconductor device and method of inspecting semiconductor device13 Aug 2026US 2026/0235675 A1Canon Kabushiki Kaisha
- Testing integrated circuits via scan chain compression16 Jul 2026US 2026/0202471 A1International Business Machines Corporation
- Scan-path integrated circuit memory with output bus feedback9 Jul 2026US 2026/0196286 A1SambaNova Systems, Inc.
- Hardware decoder for run-length encoded mask bits for in-system automatic test pattern generation (atpg)28 May 2026US 2026/0147040 A1QUALCOMM Incorporated
Most cited
By later US patents
- Arithmetic built-in self test of multiple scan-based integrated circuits174US 5,991,898 AMentor Graphics Corporation · 1999
- Simultaneous self-testing system167US 4,513,418 AInternational Business Machines Corporation · 1985
- Method and apparatus for selectively compacting test responses136US 6,557,129 B12003
- Test pattern compression for an integrated circuit test environment128US 6,327,687 B12001
- Weighted random pattern testing apparatus and method118US 4,801,870 AInternational Business Machines Corporation · 1989