G01R 1/06716
Elastic
Official title: {Elastic}
G01R1/06716 (Elastic) appears on 1,225 US grants and 1,419 published applications in this corpus.
Search patents in G01R- Granted patents
- 1,225
- Published applications
- 1,419
- Assignees
- 463
- Inventors
- 1,992
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 2 | 0 |
| 1978 | 1 | 0 |
| 1979 | 1 | 0 |
| 1980 | 2 | 0 |
| 1981 | 2 | 0 |
| 1982 | 2 | 0 |
| 1983 | 1 | 0 |
| 1984 | 2 | 0 |
| 1985 | 3 | 0 |
| 1986 | 1 | 0 |
| 1987 | 3 | 0 |
| 1988 | 7 | 0 |
| 1989 | 5 | 0 |
| 1990 | 3 | 0 |
| 1991 | 10 | 0 |
| 1992 | 3 | 0 |
| 1993 | 5 | 0 |
| 1994 | 2 | 0 |
| 1995 | 5 | 0 |
| 1996 | 7 | 0 |
| 1997 | 11 | 0 |
| 1998 | 13 | 0 |
| 1999 | 10 | 0 |
| 2000 | 11 | 0 |
| 2001 | 31 | 18 |
| 2002 | 35 | 39 |
| 2003 | 24 | 31 |
| 2004 | 39 | 36 |
| 2005 | 36 | 52 |
| 2006 | 37 | 63 |
| 2007 | 37 | 61 |
| 2008 | 38 | 83 |
| 2009 | 59 | 60 |
| 2010 | 65 | 71 |
| 2011 | 42 | 53 |
| 2012 | 36 | 51 |
| 2013 | 41 | 36 |
| 2014 | 35 | 58 |
| 2015 | 43 | 33 |
| 2016 | 33 | 44 |
| 2017 | 46 | 47 |
| 2018 | 43 | 52 |
| 2019 | 47 | 73 |
| 2020 | 61 | 59 |
| 2021 | 54 | 66 |
| 2022 | 64 | 59 |
| 2023 | 36 | 58 |
| 2024 | 54 | 89 |
| 2025 | 35 | 54 |
| 2026 | 42 | 73 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Probe head including a probe supported by a tapered hole6 Oct 2026US 12,754,210 B2Yokowo Co., Ltd.
- System and method for automatic probe card replacement22 Sep 2026US 12,742,797 B1InZiv Ltd.
- Probe mounting structure and reliability test system for wafer-level reliability test22 Sep 2026US 12,742,814 B2Semight Instruments Co., Ltd
- Measurement unit8 Sep 2026US 12,730,128 B2NHK Spring Co., Ltd.
- Probe systems and methods of operating probe systems8 Sep 2026US 12,730,143 B2FormFactor, Inc.
- Cantilever holder structure with attached electrical components for a cantilever-card assembly and methods of forming the same8 Oct 2026US 2026/0309748 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Probe head with contact probes having an improved configuration1 Oct 2026US 2026/0298977 A1Technoprobe S.P.A.
- Probe apparatus1 Oct 2026US 2026/0298978 A1Kabushiki Kaisha Nihon Micronics
- A probe head having high frequency performances1 Oct 2026US 2026/0298979 A1Technoprobe S.P.A.
- Probe and use thereof1 Oct 2026US 2026/0298980 A1Prime Planet Energy & Solutions, Inc.
Most cited
By later US patents
- Flexible contact structure with an electrically conductive shell340US 5,917,707 AFormFactor, Inc. · 1999
- Making and testing an integrated circuit using high density probe points307US 5,103,557 A1992
- Contact carriers (tiles) for populating larger substrates with spring contacts304US 5,806,181 AFormFactor, Inc. · 1998
- Lithographic contact elements265US 6,255,126 B1FormFactor, Inc. · 2001
- High density cantilevered probe for electronic devices262US 5,811,982 AInternational Business Machines Corporation · 1998