G01R 1/06722
Spring-loaded
Official title: {Spring-loaded}
G01R1/06722 (Spring-loaded) appears on 624 US grants and 701 published applications in this corpus.
Search patents in G01R- Granted patents
- 624
- Published applications
- 701
- Assignees
- 287
- Inventors
- 1,106
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 2 | 0 |
| 1978 | 1 | 0 |
| 1979 | 1 | 0 |
| 1980 | 2 | 0 |
| 1981 | 2 | 0 |
| 1982 | 2 | 0 |
| 1983 | 1 | 0 |
| 1984 | 2 | 0 |
| 1985 | 3 | 0 |
| 1986 | 1 | 0 |
| 1987 | 3 | 0 |
| 1988 | 6 | 0 |
| 1989 | 4 | 0 |
| 1990 | 2 | 0 |
| 1991 | 7 | 0 |
| 1992 | 2 | 0 |
| 1993 | 3 | 0 |
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
| 1996 | 7 | 0 |
| 1997 | 7 | 0 |
| 1998 | 7 | 0 |
| 1999 | 3 | 0 |
| 2000 | 8 | 0 |
| 2001 | 9 | 4 |
| 2002 | 12 | 11 |
| 2003 | 8 | 7 |
| 2004 | 11 | 14 |
| 2005 | 9 | 19 |
| 2006 | 19 | 20 |
| 2007 | 10 | 14 |
| 2008 | 16 | 20 |
| 2009 | 13 | 20 |
| 2010 | 21 | 27 |
| 2011 | 11 | 22 |
| 2012 | 12 | 17 |
| 2013 | 16 | 20 |
| 2014 | 16 | 34 |
| 2015 | 24 | 20 |
| 2016 | 21 | 28 |
| 2017 | 32 | 38 |
| 2018 | 30 | 36 |
| 2019 | 37 | 39 |
| 2020 | 38 | 39 |
| 2021 | 30 | 50 |
| 2022 | 45 | 35 |
| 2023 | 24 | 36 |
| 2024 | 30 | 63 |
| 2025 | 23 | 31 |
| 2026 | 27 | 37 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Probe head including a probe supported by a tapered hole6 Oct 2026US 12,754,210 B2Yokowo Co., Ltd.
- Probe mounting structure and reliability test system for wafer-level reliability test22 Sep 2026US 12,742,814 B2Semight Instruments Co., Ltd
- Measurement unit8 Sep 2026US 12,730,128 B2NHK Spring Co., Ltd.
- Contact pin and test socket having the same25 Aug 2026US 12,716,914 B2LST Corporation
- Probe25 Aug 2026US 12,716,915 B2Kabushiki Kaisha Nihon Micronics
- Probe apparatus1 Oct 2026US 2026/0298978 A1Kabushiki Kaisha Nihon Micronics
- A probe head having high frequency performances1 Oct 2026US 2026/0298979 A1Technoprobe S.P.A.
- Probe and use thereof1 Oct 2026US 2026/0298980 A1Prime Planet Energy & Solutions, Inc.
- Sealing arrangement with a seal having varying electrical properties1 Oct 2026US 2026/0304663 A1Greene, Tweed Technologies, Inc.
- Socketed Probes24 Sep 2026US 2026/0287613 A1
Most cited
By later US patents
- Coaxial contact assembly apparatus180US 6,053,777 ARika Electronics International, Inc. · 2000
- Massively parallel interface for electronic circuits134US 6,812,718 B1NanoNexus, Inc. · 2004
- Contactor for an electronic tester133US 4,773,877 AFeinmetall GmbH · 1988
- Electrical test apparatus and method122US 5,500,605 AAT&T Corp. · 1996
- Device for electrically contacting a floating semiconductor wafer having an insulating film114US 6,114,865 ASemiconductor Diagnostics, Inc. · 2000