Probe and use thereof
AssigneePrime Planet Energy & Solutions, Inc.
InventorsTaku MATSUO, Kanaru HASHISAKE, Ryosuke IWATA
Life of this patent
Estimating the term…
Abstract
A probe disclosed herein includes: an electrically conductive probe pin; a pressing member to press the probe pin against a test object; and a bearing portion holding the probe pin such that the probe pin is rotatable around an axis extending in a longitudinal direction of the probe pin. A front end of the probe pin includes: a flat contact portion that comes into direct contact with the test object; and a groove extending from a center of the front end toward its outer periphery.
Claims10
A probe comprising:
- an electrically conductive probe pin;
- a pressing member to press the probe pin against a test object;
- and
- a bearing portion holding the probe pin such that the probe pin is rotatable around an axis extending in a longitudinal direction of the probe pin, wherein
- a front end of the probe pin includes
- a flat contact portion that comes into direct contact with the test object, and
- a groove extending from a center of the front end toward its outer periphery.
A probe unit to be connected to an electricity storage device, the probe unit comprising:
- a first probe to be connected to a first electrode;
- and
- a second probe to be connected to a second electrode, wherein
- the first probe includes
- a first probe pin that is electrically conductive,
- a first probe pressing member to press the first probe against the first electrode, and
- a first probe bearing portion holding the first probe pin such that the first probe pin is rotatable around an axis extending in a longitudinal direction of the first probe pin,
- the second probe includes
- a second probe pin that is electrically conductive,
- a second probe pressing member to press the second probe against the second electrode, and
- a second probe bearing portion holding the second probe pin such that the second probe pin is rotatable around an axis extending in a longitudinal direction of the second probe pin,
- a front end of the first probe pin includes
- a flat contact portion that comes into direct contact with the first electrode, and
- a groove extending from a center of the front end of the first probe pin toward its outer periphery, and
- a front end of the second probe pin includes
- a flat contact portion that comes into direct contact with the second electrode, and
- a groove extending from a center of the front end of the second probe pin toward its outer periphery.
A testing method for testing an electric characteristic of a test object by bringing a front end of a probe into contact with the test object, the method comprising:
- a contact step of bringing the front end of the probe into contact with a terminal of the test object;
- a pressing and rotating step of rotating the front end of the probe while pressing the front end that is in contact with the terminal;
- a supplying step of supplying an electric current or electric signal to the test object;
- and
- a measuring step of measuring the electric characteristic of the test object based on an electric signal received from the test object.
Dependencies are inferred from the claim text.