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US 12,716,914 B2Granted
Contact pin and test socket having the same
AssigneeLST Corporation
InventorsGwanhyung Lee, Seungdoo Kwon
Life of this patent
Estimating the term…
Abstract
The present invention relates to a contact pin, and more particularly, to a contact pin installed in a test socket performing a test on a semiconductor device and a test socket having the same. The present invention discloses a contact pin including: a first member (100) including a first terminal (120) disposed at one end thereof to contact one of a test terminal and a terminal of a semiconductor product; a second member (300) including a second terminal disposed at one end thereof to contact the other of the test terminal and the terminal of the semiconductor product; and a coil spring (200) into which at least a portion of a movably overlapped portion of the first member (100) and the second member (300) is inserted.
Claims21
A contact pin comprising:
- a first member having a first terminal disposed at one end thereof to contact one of a test terminal and a terminal of a semiconductor product;
- a second member having a second terminal contacting another of the test terminal and the terminal of the semiconductor product;
- and
- a coil spring into which at least a portion of a movably overlapped portion of the first member and the second member is inserted,
- wherein the first member comprises a first plate-shaped member having a bent hook portion formed at another end thereof and a first pressing portion spaced apart from the hook portion to press one end of the coil spring,
- wherein the second member comprises a second plate-shaped member in which a hook stepped portion disposed in parallel with the first plate-shaped member is formed at one end so that the hook portion is hooked in a direction in which the coil spring is spread and moves in a direction in which the coil spring is contracted, and a second pressing portion configured to press another end of the coil spring is formed at another end of the second member, and
- wherein the second plate-shaped member comprises:
- a first parallel portion parallel to the first plate-shaped member;
- a bent portion integrally bent with the first parallel portion so as to be engaged with a portion in which the hook portion of the first plate-shaped member is formed;
- and
- a second parallel portion integrated with the bent portion so as to be parallel with the first parallel portion and connected to the second terminal.
8 more elements
A contact pin comprising:
- a first member having a first terminal disposed at one end thereof to contact one of a test terminal and a terminal of a semiconductor product;
- a second member having a second terminal contacting another of the test terminal and the terminal of the semiconductor product;
- and
- a coil spring into which at least a portion of a movably overlapped portion of the first member and the second member is inserted,
- wherein the first member comprises:
- a first plate-shaped member having one end connected with the first terminal and another end on which a bent hook portion is formed;
- and
- a first pressing portion formed on the first terminal to press one end of the coil spring,
- wherein the second member comprises:
- a second plate-shaped member having one end connected with the second terminal and overlapping the first plate-shaped member;
- and
- a protruding portion formed at one side of the second plate-shaped member to surround the first plate-shaped member, thereby pressing another end of the coil spring,
- wherein the protruding portion is hooked by the hook portion in a direction in which the coil spring is spread by a relative movement of the first plate-shaped member and the second plate-shaped member, and
- wherein the protruding portion comprises:
- a parallel portion in parallel to the second plate-shaped member with the first plate-shaped member therebetween;
- a connection portion configured to connect the second plate-shaped member and the parallel portion;
- and
- a bent portion bent from the parallel portion in a direction away from the first plate-shaped member.
15 more elements
A contact pin comprising:
- a first member having a first terminal disposed at one end thereof to contact one of a test terminal and a terminal of a semiconductor product;
- a second member having a second terminal contacting another of the test terminal and the terminal of the semiconductor product;
- and
- a coil spring into which at least a portion of a movably overlapped portion of the first member and the second member is inserted,
- wherein the coil spring comprises:
- a first coil spring portion installed adjacent to the first terminal;
- and
- a second coil spring portion installed adjacent to the second terminal and connected with the first coil spring portion,
- wherein a spring diameter of the first coil spring portion is different from a spring diameter of the second coil spring portion,
- wherein the spring diameter of the first coil spring portion is less than the spring diameter of the second coil spring portion, and
- wherein a length difference between the spring diameter of the first coil spring portion and a diagonal length of a horizontal cross-section of the movably overlapped portion of the first member and the second member is 0.05 mm or less.
8 more elements
Dependencies are inferred from the claim text.