G01R 1/067
Measuring probes
G01R1/067 (Measuring probes) appears on 6,864 US grants and 6,310 published applications in this corpus.
Search patents in G01R- Granted patents
- 6,864
- Published applications
- 6,310
- Assignees
- 1,768
- Inventors
- 9,947
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 17 | 0 |
| 1977 | 25 | 0 |
| 1978 | 18 | 0 |
| 1979 | 15 | 0 |
| 1980 | 17 | 0 |
| 1981 | 16 | 0 |
| 1982 | 19 | 0 |
| 1983 | 23 | 0 |
| 1984 | 20 | 0 |
| 1985 | 30 | 0 |
| 1986 | 49 | 0 |
| 1987 | 48 | 0 |
| 1988 | 61 | 0 |
| 1989 | 89 | 0 |
| 1990 | 88 | 0 |
| 1991 | 68 | 0 |
| 1992 | 74 | 0 |
| 1993 | 67 | 0 |
| 1994 | 69 | 0 |
| 1995 | 110 | 0 |
| 1996 | 126 | 0 |
| 1997 | 116 | 0 |
| 1998 | 123 | 0 |
| 1999 | 140 | 0 |
| 2000 | 144 | 0 |
| 2001 | 177 | 100 |
| 2002 | 211 | 197 |
| 2003 | 180 | 208 |
| 2004 | 188 | 238 |
| 2005 | 202 | 276 |
| 2006 | 229 | 289 |
| 2007 | 225 | 284 |
| 2008 | 219 | 358 |
| 2009 | 203 | 262 |
| 2010 | 250 | 235 |
| 2011 | 183 | 194 |
| 2012 | 146 | 173 |
| 2013 | 136 | 197 |
| 2014 | 165 | 245 |
| 2015 | 209 | 256 |
| 2016 | 209 | 191 |
| 2017 | 219 | 217 |
| 2018 | 215 | 219 |
| 2019 | 223 | 261 |
| 2020 | 244 | 261 |
| 2021 | 250 | 270 |
| 2022 | 236 | 232 |
| 2023 | 198 | 251 |
| 2024 | 215 | 305 |
| 2025 | 195 | 258 |
| 2026 | 165 | 333 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01R 1/073Multiple probes4,088
- G01R 1/06711Probe needles2,285
- G01R 1/06772High frequency probes691
- G01R 1/07Non contact-making probes465
- G01R 1/06788Hand-held or hand-manipulated probes446
- G01R 1/06705Apparatus for holding or moving single probes341
- G01R 1/06766Input circuits therefor256
- G01R 1/06794Devices for sensing when probes are in contact, or in position to247
All 10 subgroupsShow fewer
Recent patents
- Ceramic, probe guiding member, probe card and socket for package inspection6 Oct 2026US 12,753,124 B2Ferrotec Material Technologies Corporation
- Probe head including a probe supported by a tapered hole6 Oct 2026US 12,754,210 B2Yokowo Co., Ltd.
- Charge/discharge inspection device and charge/discharge inspection equipment6 Oct 2026US 12,754,239 B2Nippon Steel Texeng. Co., Ltd.
- Electrical connecting device and method for manufacturing electrical connecting device29 Sep 2026US 12,748,130 B2Kabushiki Kaisha Nihon Micronics
- Probe assembly with downward-protruding probe shield and methods of operating the same29 Sep 2026US 12,748,131 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Cantilever holder structure with attached electrical components for a cantilever-card assembly and methods of forming the same8 Oct 2026US 2026/0309748 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Probe8 Oct 2026US 2026/0309749 A1Kabushiki Kaisha Nihon Micronics
- Multi-prober cartridge8 Oct 2026US 2026/0309750 A1Korea Institute of Industrial Technology
- Conductive probing interface device8 Oct 2026US 2026/0309775 A1International Business Machines Corporation
- Alloy material and contact probe1 Oct 2026US 2026/0297706 A1NHK Spring Co., Ltd.
Most cited
By later US patents
- Signal processing appparatus and methods797US 5,335,277 AThe Personalized Mass Media Corporation · 1994
- Signal processing apparatus and methods615US 4,965,825 AThe Personalized Mass Media Corporation · 1990
- Signal processing apparatus and methods470US 5,233,654 AThe Personalized Mass Media Corporation · 1993
- Sockets for electronic components and methods of connecting to electronic components453US 5,772,451 AForm Factor, Inc. · 1998
- Signal processing apparatus and methods449US 5,109,414 AThe Personalized Mass Media Corporation · 1992