G01R 1/06794
Devices for sensing when probes are in contact, or in position to
Official title: {Devices for sensing when probes are in contact, or in position to contact, with measured object}
G01R1/06794 (Devices for sensing when probes are in contact, or in position to) appears on 247 US grants and 363 published applications in this corpus.
Search patents in G01R- Granted patents
- 247
- Published applications
- 363
- Assignees
- 151
- Inventors
- 643
- Latest grant
- 11 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 2 | 0 |
| 1989 | 2 | 0 |
| 1990 | 1 | 0 |
| 1991 | 3 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 3 | 0 |
| 1995 | 4 | 0 |
| 1996 | 2 | 0 |
| 1997 | 5 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 4 | 0 |
| 2001 | 2 | 3 |
| 2002 | 6 | 11 |
| 2003 | 2 | 3 |
| 2004 | 5 | 6 |
| 2005 | 4 | 8 |
| 2006 | 8 | 7 |
| 2007 | 6 | 12 |
| 2008 | 12 | 6 |
| 2009 | 10 | 7 |
| 2010 | 4 | 6 |
| 2011 | 6 | 2 |
| 2012 | 3 | 2 |
| 2013 | 0 | 7 |
| 2014 | 4 | 10 |
| 2015 | 5 | 11 |
| 2016 | 8 | 15 |
| 2017 | 8 | 12 |
| 2018 | 14 | 14 |
| 2019 | 14 | 13 |
| 2020 | 14 | 19 |
| 2021 | 17 | 28 |
| 2022 | 21 | 11 |
| 2023 | 12 | 12 |
| 2024 | 14 | 18 |
| 2025 | 13 | 14 |
| 2026 | 6 | 106 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Contact sensor for detecting loose sprocket segments of a final drive11 Aug 2026US 12,704,528 B2Caterpillar Inc.
- Quick coupling probe head28 Jul 2026US 12,693,312 B2Mpi Corporation
- Testing device, testing method, and non-transitory storage medium storing testing program28 Jul 2026US 12,693,313 B2Sumitomo Electric Industries, Ltd.
- Testing device and method, and non-transitory computer-readable recording medium26 May 2026US 12,638,494 B2Tokyo Electron Limited
- Method for determining contact or connection state, and information processing device28 Apr 2026US 12,613,260 B2National Institute of Advanced Industrial Science and Technology
- Foreign object detection device and method for a separable connector interface24 Sep 2026US 2026/0287683 A1TE Connectivity Solutions GmbH
- Moving Device, Inspection Device, and Moving Method27 Aug 2026US 2026/0251703 A1Tokyo Electron Limited
- Simultaneous Silicon Spring and Chip Singulation DRIE13 Aug 2026US 2026/0239987 A1
- High Current Column Grid Array Pillars13 Aug 2026US 2026/0240010 A1
- Prober and probe inspection method6 Aug 2026US 2026/0227428 A1Tokyo Seimitsu Co., Ltd.
Most cited
By later US patents
- Wafer prober135US 4,864,227 ACanon Kabushiki Kaisha · 1989
- Wafer probe station having full guarding126US 5,457,398 ACascade Microtech, Inc. · 1995
- Probe apparatus for inspecting electrical characteristics of a microelectronic element126US 5,644,245 ATokyo Electron FE Limited · 1997
- Piezoelectric pressure sensing apparatus for integrated circuit testing stations125US 4,673,839 ATektronix, Inc. · 1987
- Pressure control apparatus for use in an integrated circuit testing station122US 4,758,785 ATektronix, Inc. · 1988