Pressure control apparatus for use in an integrated circuit testing station

A pressure control apparatus for use in an integrated circuit testing station having a probe, and lift means beneath said probe for elevating an integrate circuit upward toward and against said probe, said pressure control apparatus comprising:

• a support structure;
• a pressure pad movably attached to said support structure directly above said probe;
• means for resiliently attaching said pressure pad to said support structure in a manner permitting a vertical movement of said pressure pad relative to said support structure;
• and
• sensor means associated with said pressure pad for stopping an upward movement of said integrated circuit against said probe when a desired pressure level exerted by said integrated circuit against said probe has been reached comprising an elongate conductive member secured to said means for resiliently attaching said pressure pad to said support structure, said conductive member having first and second ends, said first end being electrically connected to said lift means, and a conductor pad secured to said support structure and insulated therefrom, said pad being electrically connected to said lift means, said second end of said elongate conductive member normally being in contact with said pad, and coming out of contact therewith when said integrated circuit reaches said probe and exerts said desired pressure thereon.

A pressure control apparatus for use in an integrated circuit testing station having a probe secured to a support structure, and lift means beneath said probe for elevating an integrated circuit upward toward and against said probe, said pressure control apparatus comprising:

• a pressure pad movably attached to said support structure directly above said probe;
• means for resiliently attaching said pressure pad to said support structure in a manner permitting a vertical movement of said pressure pad relative to said support structure, said means comprising a resilient retaining member having a center portion to which said pressure pad is secured;
• and
• sensor means assoicated with said pressure pad for stopping an upward movement of said integrated circuit against said probe when a desired pressure level exerted by said integrated circuit against said probe has been reached, said sensor means comprising an elongate conductive member secured to said resilient retaining member, said elongate conductive member having first and second ends, said first end being electrically connected to said lift means, said sensor means further comprising a conductor pad secured to said support structure and insulated therefrom, said conductor pad being electrically connected to said lift means, said second end of said elongate conductive member normally being in contact with said conductor pad, and coming out of contact with said conductor pad when said integrated circuit reaches said probe and exerts said desired pressure thereon.

A pressure control apparatus for use in an integrated circuit testing station having a probe, and lift means beneath said probe for elevating an integrated circuit upward toward and against said probe, said pressure control apparatus comprising:

• a support structure;
• a pressure pad movably attached to said support structure directly above said probe;
• means for resiliently attaching said pressure pad to said support structure in a manner permitting the vertical movement of said pressure pad relative to said support structure, said means comprising a resilient retaining member having a center portion to which said pressure pad is attached, said support structure comprising a ring-shaped member having an open center portion therein, said resilient retaining member being attached to said ring-shaped member at a position thereon wherein said pressure pad on said resilient retaining member is positioned within said open center portion of said ring-shaped member;
• sensor means associated with said pressure pad for stopping an upward movement of said integrated circuit against said probe when a desired pressure level exerted by said integrated circuit against said probe has been reached, said sensor means comprising an elongate conductive memer secured to said resilient retaining member, said elongate conductive member having first and second ends, said first end being electrically connected to said lift means, said sensor means further comprising a conductor pad secured to said support structure and insulated therefrom, said conductor pad being electically connected to said lift means, said second end of said elongate conductive member being normally in contact with said conductor pad, and coming out of contact with said conductor pad when said integrated circuit reaches said probe and exerts said desired pressure thereon;
• and
• tension adjustment means for controlling the amount of pressure necessary to bring said second end of said elongate conductive member out of contact with said conductor pad on said support structure, said tension adjustment means comprising a retaining block having means therein for engaging said second end of said elongate conductive member in a manner wherein said second end is urged downward toward said conductor pad on said support structure.