Method for determining contact or connection state, and information processing device

A non-transitory computer readable medium storing a program that causes a computer to execute the steps of:

• calculating a coefficient matrix for fitting a predetermined function matrix to a frequency characteristic of an S parameter measured at a current contact state of a probe, or at a current connection state of a coaxial connector or a waveguide for a plurality of frequencies;
• calculating a value of a first local outlier factor based on the calculated coefficient matrix;
• when the probe is used, determining, in accordance with whether the calculated first local outlier factor has exceeded a threshold, whether the probe is in a first state in which the probe is in contact with a predetermined object;
• or
• when the coaxial connector or the waveguide is used, determining based on a relationship between the calculated first local outlier factor and a threshold, whether the coaxial connector of the waveguide is in a second state in which the coaxial connector or the waveguide is failed in connection with a predetermined object;
• and
• passing or failing the predetermined object based on a result of inspection from the measuring the S parameter, the calculating the coefficient matrix, and the determining in accordance with whether the calculated first local outlier factor has exceeded a threshold, or the determining based on the relationship between the calculated first outlier factor and the threshold.

An information processing device comprising:

• memory;
• and
• a processor connected to the memory;
• wherein the processor is configured to execute the steps of:
• calculating a coefficient matrix for fitting a predetermined function matrix to a frequency characteristic of an S parameter measured at a current contact state of a probe, or at a current connection state of a coaxial connector or a waveguide for a plurality of frequencies;
• calculating a value of a first local outlier factor based on the calculated coefficient matrix;
• when the probe is used, determining, in accordance with whether the calculated first local outlier factor has exceeded a threshold, whether the probe is in a first state in which the probe is in contact with a predetermined object;
• or
• when the coaxial connector or the waveguide is used, determining based on a relationship between the calculated first local outlier factor and a threshold, whether the coaxial connector or the waveguide is in a second state in which the coaxial connector or the waveguide is failed in connection with a predetermined object;
• and
• passing or failing the predetermined object based on a result of inspection from the measuring the S parameter, the calculating the coefficient matrix, and the determining in accordance with whether the calculated first local outlier factor has exceeded a threshold, or the determining based on the relationship between the calculated first outlier factor and the threshold.