G01R 1/06
Measuring leads
Official title: Measuring leads; Measuring probes (G01R19/145, G01R19/165 take precedence)
G01R1/06 (Measuring leads) appears on 6,934 US grants and 6,355 published applications in this corpus.
Search patents in G01R- Granted patents
- 6,934
- Published applications
- 6,355
- Assignees
- 1,783
- Inventors
- 10,074
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 17 | 0 |
| 1977 | 25 | 0 |
| 1978 | 18 | 0 |
| 1979 | 15 | 0 |
| 1980 | 18 | 0 |
| 1981 | 18 | 0 |
| 1982 | 19 | 0 |
| 1983 | 24 | 0 |
| 1984 | 20 | 0 |
| 1985 | 32 | 0 |
| 1986 | 50 | 0 |
| 1987 | 52 | 0 |
| 1988 | 63 | 0 |
| 1989 | 89 | 0 |
| 1990 | 88 | 0 |
| 1991 | 72 | 0 |
| 1992 | 76 | 0 |
| 1993 | 67 | 0 |
| 1994 | 70 | 0 |
| 1995 | 110 | 0 |
| 1996 | 133 | 0 |
| 1997 | 117 | 0 |
| 1998 | 128 | 0 |
| 1999 | 142 | 0 |
| 2000 | 144 | 0 |
| 2001 | 177 | 100 |
| 2002 | 211 | 197 |
| 2003 | 180 | 208 |
| 2004 | 188 | 238 |
| 2005 | 202 | 279 |
| 2006 | 229 | 289 |
| 2007 | 225 | 286 |
| 2008 | 222 | 361 |
| 2009 | 205 | 264 |
| 2010 | 252 | 236 |
| 2011 | 185 | 197 |
| 2012 | 146 | 173 |
| 2013 | 138 | 200 |
| 2014 | 171 | 249 |
| 2015 | 209 | 259 |
| 2016 | 213 | 193 |
| 2017 | 220 | 219 |
| 2018 | 217 | 222 |
| 2019 | 227 | 264 |
| 2020 | 245 | 262 |
| 2021 | 252 | 271 |
| 2022 | 237 | 235 |
| 2023 | 200 | 251 |
| 2024 | 215 | 309 |
| 2025 | 196 | 260 |
| 2026 | 165 | 333 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Ceramic, probe guiding member, probe card and socket for package inspection6 Oct 2026US 12,753,124 B2Ferrotec Material Technologies Corporation
- Probe head including a probe supported by a tapered hole6 Oct 2026US 12,754,210 B2Yokowo Co., Ltd.
- Charge/discharge inspection device and charge/discharge inspection equipment6 Oct 2026US 12,754,239 B2Nippon Steel Texeng. Co., Ltd.
- Electrical connecting device and method for manufacturing electrical connecting device29 Sep 2026US 12,748,130 B2Kabushiki Kaisha Nihon Micronics
- Probe assembly with downward-protruding probe shield and methods of operating the same29 Sep 2026US 12,748,131 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Cantilever holder structure with attached electrical components for a cantilever-card assembly and methods of forming the same8 Oct 2026US 2026/0309748 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Probe8 Oct 2026US 2026/0309749 A1Kabushiki Kaisha Nihon Micronics
- Multi-prober cartridge8 Oct 2026US 2026/0309750 A1Korea Institute of Industrial Technology
- Conductive probing interface device8 Oct 2026US 2026/0309775 A1International Business Machines Corporation
- Alloy material and contact probe1 Oct 2026US 2026/0297706 A1NHK Spring Co., Ltd.
Most cited
By later US patents
- Signal processing appparatus and methods797US 5,335,277 AThe Personalized Mass Media Corporation · 1994
- Signal processing apparatus and methods615US 4,965,825 AThe Personalized Mass Media Corporation · 1990
- Signal processing apparatus and methods470US 5,233,654 AThe Personalized Mass Media Corporation · 1993
- Sockets for electronic components and methods of connecting to electronic components453US 5,772,451 AForm Factor, Inc. · 1998
- Signal processing apparatus and methods449US 5,109,414 AThe Personalized Mass Media Corporation · 1992