Multi-prober cartridge
AssigneeKorea Institute of Industrial Technology
InventorsSUNGWON CHOO, Kyung Tae Nam, Seung Kee Mo
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AssigneeKorea Institute of Industrial Technology
InventorsSUNGWON CHOO, Kyung Tae Nam, Seung Kee Mo
Estimating the term…
According to one aspect of the present disclosure, the multi-prober cartridge includes: a probe card including a main circuit board electrically connected to a plurality of probes, and an edge frame supporting an edge region of the main circuit board; a wafer chuck supporting a wafer that contacts the plurality of probes; and a coupling auxiliary structure coupled to the probe card so as to be coupled to the wafer chuck to couple the probe card to the wafer chuck. The coupling auxiliary structure includes: a base plate supporting one surface of the edge frame; a coupling member having one side fixed to the base plate and the other side pressing the other surface of the edge frame to couple the probe card to the base plate; and an electromagnet part fixed to the base plate and magnetically engageable with a chuck electromagnet part fixed to the wafer chuck.
A multi-prober cartridge, comprising:
A multi-prober cartridge, comprising:
A multi-prober cartridge, comprising:
Dependencies are inferred from the claim text.