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US 12,754,210 B2Granted
Probe head including a probe supported by a tapered hole
AssigneeYokowo Co., Ltd.
InventorsYusuke Shimizu, Katsuhiko Sato, Takayoshi Okuno
Life of this patent
Estimating the term…
Abstract
A probe head including a probe and an insulating support provided with a tapered hole to support a plurality of portions of the probe.
Claims12
A probe head comprising:
- a probe;
- and
- an insulating support provided with a tapered hole to support the probe, wherein the probe includes:
- a tapered portion decreasing in diameter from one end side to the other end side of the tapered portion;
- and
- a wide portion including a region located around the one end side of the tapered portion, the region of the wide portion is substantially parallel to a direction perpendicular to an extension direction of the probe, the wide portion of the probe has a width wider than a diameter of the one end side of the tapered portion of the probe, the tapered hole of the insulating support includes an inner side surface and an edge, the edge being at a boundary between the tapered hole and a through-hole communicating with the tapered hole, the inner side surface of the tapered hole and the edge of the tapered hole define a dual-contact interface that simultaneously supports the wide portion of the probe and the tapered portion of the probe, respectively, through direct physical contact between the inner side surface and the wide portion and between the edge and the tapered portion, and the tapered portion of the probe has a tapered angle less than a tapered angle of the tapered hole.
3 more elements
A probe head comprising:
- a probe;
- and
- an insulating support provided with a tapered hole to support the probe, wherein the probe includes:
- a tapered portion decreasing in diameter from one end side to the other end side of the tapered portion;
- and
- a wide portion including a region located around the one end side of the tapered portion, the region of the wide portion is substantially parallel to a direction perpendicular to an extension direction of the probe, the wide portion of the probe has a width wider than a diameter of the one end side of the tapered portion of the probe, the tapered hole of the insulating support includes an inner side surface and an edge, the edge being at a boundary between the tapered hole and a through-hole communicating with the tapered hole, the inner side surface of the tapered hole and the edge of the tapered hole define a dual-contact interface that simultaneously supports the wide portion of the probe and the tapered portion of the probe, respectively, through direct physical contact between the inner side surface and the wide portion and between the edge and the tapered portion, and the tapered portion and the wide portion are contiguous with one another.
3 more elements
A probe head comprising:
- a probe;
- and
- an insulating support provided with a tapered hole to support the probe, wherein the probe includes:
- a tapered portion decreasing in diameter from one end side to the other end side of the tapered portion;
- and a wide portion including a region located around the one end side of the tapered portion, the region of the wide portion is substantially parallel to a direction perpendicular to an extension direction of the probe, the wide portion of the probe has a width wider than a diameter of the one end side of the tapered portion of the probe, the tapered hole of the insulating support includes an inner side surface and an edge, the edge being at a boundary between the tapered hole and a through-hole communicating with the tapered hole, the inner side surface of the tapered hole and the edge of the tapered hole define a dual-contact interface that simultaneously supports the wide portion of the probe and the tapered portion of the probe, respectively, through direct physical contact between the inner side surface and the wide portion and between the edge and the tapered portion, the edge is an annular edge extending continuously around the through-hole, and the direct physical contact between the edge of the tapered hole and the tapered portion occurs continuously along a circumference of the tapered portion.
2 more elements
Dependencies are inferred from the claim text.