G01R 1/06705
Apparatus for holding or moving single probes
Official title: {Apparatus for holding or moving single probes (for moving multiple probe heads or ICs under test G01R31/2886)}
G01R1/06705 (Apparatus for holding or moving single probes) appears on 341 US grants and 233 published applications in this corpus.
Search patents in G01R- Granted patents
- 341
- Published applications
- 233
- Assignees
- 185
- Inventors
- 672
- Latest grant
- 2 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 3 | 0 |
| 1978 | 3 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 2 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 3 | 0 |
| 1986 | 2 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 3 | 0 |
| 1990 | 5 | 0 |
| 1991 | 8 | 0 |
| 1992 | 3 | 0 |
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 5 | 0 |
| 1996 | 13 | 0 |
| 1997 | 18 | 0 |
| 1998 | 15 | 0 |
| 1999 | 7 | 0 |
| 2000 | 15 | 0 |
| 2001 | 10 | 7 |
| 2002 | 16 | 8 |
| 2003 | 8 | 6 |
| 2004 | 4 | 8 |
| 2005 | 4 | 10 |
| 2006 | 9 | 10 |
| 2007 | 8 | 9 |
| 2008 | 9 | 7 |
| 2009 | 9 | 3 |
| 2010 | 4 | 4 |
| 2011 | 6 | 7 |
| 2012 | 2 | 1 |
| 2013 | 3 | 11 |
| 2014 | 4 | 4 |
| 2015 | 12 | 21 |
| 2016 | 8 | 15 |
| 2017 | 18 | 11 |
| 2018 | 9 | 11 |
| 2019 | 15 | 12 |
| 2020 | 14 | 10 |
| 2021 | 13 | 6 |
| 2022 | 7 | 7 |
| 2023 | 8 | 12 |
| 2024 | 9 | 16 |
| 2025 | 13 | 12 |
| 2026 | 3 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Electric fencing wire tester2 Jun 2026US 12,644,906 B2Forcefield Active Technology Limited
- Rotating body inspection device for electrification component5 May 2026US 12,618,869 B2Viewon Co., Ltd.
- Circuit board detection device10 Mar 2026US 12,571,834 B2Mpi Corporation
- Touch screen testing platform for engaging a dynamically positioned target feature16 Dec 2025US 12,496,725 B2T-Mobile USA, Inc.
- Electrical testing device with probe having an adjustable angle16 Dec 2025US 12,498,398 B2
- Semiconductor testing device, attachment/detachment system for signal transmission unit, and attachment/detachment method for signal transmission unit2 Jul 2026US 2026/0186020 A1Kabushiki Kaisha Nihon Micronics
- Nanoprobe manufacturing machine and method of manufacturing nanoprobe25 Jun 2026US 2026/0177586 A1United Microelectronics Corp.
- Foldable test bench2 Apr 2026US 2026/0092951 A1Magicmotorsport S.R.L.
- Iv detection mechanism for 0bb silicon wafers26 Mar 2026US 2026/0088757 A1Guangdong Kelongwei Automation Equipment Co., Ltd.
- Manufacturing jig for electrical connection device and method of manufacturing electrical connection device29 Jan 2026US 2026/0029427 A1Kabushiki Kaisha Nihon Micronics
Most cited
By later US patents
- Probe apparatus with tilt correction mechanisms156US 5,804,983 ATokyo Electron Limited · 1998
- Wafer probe station having full guarding126US 5,457,398 ACascade Microtech, Inc. · 1995
- Wafer probe station having integrated guarding, Kelvin connection and shielding systems122US 5,345,170 ACascade Microtech, Inc. · 1994
- Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane120US 5,656,942 AElectroglas, Inc. · 1997
- High speed precision chuck assembly117US 4,066,943 AElectroglas, Inc. · 1978