G01R 1/06777
High voltage probes
Official title: {High voltage probes}
G01R1/06777 (High voltage probes) appears on 69 US grants and 67 published applications in this corpus.
Search patents in G01R- Granted patents
- 69
- Published applications
- 67
- Assignees
- 56
- Inventors
- 180
- Latest grant
- 10 Feb 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 3 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 2 | 0 |
| 1993 | 0 | 0 |
| 1994 | 2 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 1 |
| 2002 | 1 | 1 |
| 2003 | 0 | 1 |
| 2004 | 2 | 2 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 2 | 1 |
| 2008 | 1 | 5 |
| 2009 | 3 | 0 |
| 2010 | 1 | 0 |
| 2011 | 1 | 1 |
| 2012 | 0 | 3 |
| 2013 | 0 | 10 |
| 2014 | 6 | 8 |
| 2015 | 8 | 4 |
| 2016 | 3 | 0 |
| 2017 | 6 | 3 |
| 2018 | 1 | 3 |
| 2019 | 4 | 3 |
| 2020 | 4 | 4 |
| 2021 | 3 | 3 |
| 2022 | 3 | 3 |
| 2023 | 4 | 1 |
| 2024 | 2 | 2 |
| 2025 | 0 | 3 |
| 2026 | 1 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Voltage and current probe assemblies for radio frequency current carrying conductors10 Feb 2026US 12,546,802 B2Lam Research Corporation
- Test device31 Dec 2024US 12,181,495 B2Quanta Computer Inc.
- Probe card for testing power devices under high temperature and high voltage3 Dec 2024US 12,158,481 B2Maxone Semiconductor (Suzhou) Co., Ltd.
- Coaxial contact having an open-curve shape26 Dec 2023US 11,855,376 B2Teradyne, Inc.
- Voltage sensing mechanism23 May 2023US 11,655,792 B2Trillium Worldwide, Inc.
- Probe assembly for test and burn-in having a contact probe13 Aug 2026US 2026/0235644 A1Kes Systems & Service (1993) Pte Ltd.
- High-voltage surge testing14 May 2026US 2026/0133223 A1
- Method, assembly and sense unit for measuring the frequency response of a plurality of electrical objects5 Mar 2026US 2026/0063692 A1Megger Sweden AB
- Arc suppression in a wafer testing environment29 Jan 2026US 2026/0029434 A1Celadon Systems, Inc.
- Test system and method for performing high-voltage testing on a device under test22 Jan 2026US 2026/0023099 A1Mpi Corporation
Most cited
By later US patents
- Method for remotely detecting an electric field using a liquid crystal device154US 4,818,072 ARaychem Corporation · 1989
- Probe for testing a device under test66US 6,815,963 B2Cascade Microtech, Inc. · 2004
- Probe for testing a device under test39US 7,161,363 B2Cascade Microtech, Inc. · 2007
- Pressure contact for connecting a coaxial shield to a microstrip ground plane36US 5,308,250 AHewlett-Packard Company · 1994
- Digital high-voltage meter device27US 5,136,234 AHastings Fiber Glass Products, Inc. · 1992