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US 12,181,495 B2Granted
Test device
AssigneeQuanta Computer Inc.
InventorsWei-Chih Hung, Ying-Ping Chiang, Yu-Ren Ruan, Chia-Hao Wu
Life of this patent
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Abstract
A test device includes a power compensation module and a test module. The power compensation module receives AC power generated by a device under test to generate DC power to the device under test. The test module provides a plurality of test signals and a test mode to the device under test for testing the device under test.
Claims5
A test device, comprising:
- a power compensation module, configured to receive AC power generated by a device under test to generate DC power to the device under test;
- and
- a test module, configured to provide a plurality of test signals and a test mode to the device under test for testing the device under test;
- wherein the test module comprises:
- a temperature sensor, configured to sense temperature of the power compensation module to generate a temperature signal;
- a signal-generator module, configured to generate a rotational speed signal according to a first control signal;
- a voltage-generator module, configured to generate a voltage signal according to a second control signal and an external voltage;
- a control module, configured to generate the first control signal and the second control signal;
- and
- a first transmission interface, configured to transmit the temperature signal, the rotational speed signal, the voltage signal and a test mode to the device under test;
- wherein the voltage-generator module comprises:
- a voltage converter, configured to convert the external voltage to a working voltage;
- a power source unit, configured to generate the voltage signal according to the working voltage;
- and
- a relay, configured to provide the voltage signal to the first transmission interface according to the second control signal.
12 more elements
Dependencies are inferred from the claim text.