High-voltage surge testing

A probe for high-voltage surge testing of a device under test, DUT, comprising:

• a handle configured to be gripped by an operator to position the probe onto the DUT;
• an adapter configured to releasably attach a proximal end of a contact electrode to the handle;
• a current conductor configured to couple the contact electrode to a high-voltage surge generator to deliver a high-voltage surge current to the DUT via a distal end of the contact electrode;
• a voltage measurement conductor configured to couple the contact electrode to a voltage measurement circuit;
• and
• an operator-actuated trigger mechanism configured to assume at least a neutral state, a first actuation state, and a second actuation state, each of the first and second actuation states configured to trigger the delivery of the high-voltage surge current to the device under test.

An apparatus for high-voltage surge testing of a device under test, DUT, comprising:

• a first probe configured to electrically contact a first test location of the DUT;
• a second probe configured to electrically contact a second test location of the DUT;
• a high-voltage surge generator coupled to the first and second probes and configured to deliver a high-voltage surge current passing between the first test location and the second test location;
• a voltage measurement circuit coupled to the first and second probes and configured to determine a voltage difference between the first test location and the second test location;
• wherein the first probe comprises:
• a first contact electrode configured to engage the first test location, and
• a first trigger mechanism;
• wherein the second probe comprises:
• a second contact electrode configured to engage the second test location, and
• a second trigger mechanism;
• and
• wherein the first and second trigger mechanisms are configured such that concurrent actuation of the first trigger mechanism and the second trigger mechanism triggers the delivery of the high-voltage surge current to the DUT.