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US 2026/0235644 A1Published application
Probe assembly for test and burn-in having a contact probe
AssigneeKes Systems & Service (1993) Pte Ltd.
InventorsHock Soon Sim, Zhiyun Ke
Life of this patent
Estimating the term…
Abstract
A probe assembly having at least one guide plate, the guide plate having a plurality of holes. There is at least one probe extending through at least one hole in the guide plate. The at least one probe has a catch structure on its proximal end for suspending the probe in the hole of the guide plate and preventing it from passing therethrough. The catch structure is selected from the group consisting of a flange and a bent portion.
Claims14
A probe assembly comprising:
- at least one guide plate, the guide plate having a plurality of holes;
- at least one probe extending through at least one hole in the guide plate;
- and
- the at least one probe comprising a catch structure on its proximal end for suspending the probe in the hole of the guide plate and preventing it from passing therethrough, wherein the catch structure is selected from the group consisting of a flange and a bent portion.
1 more element
A method for testing an electrical device, the method comprising:
- providing a probe assembly comprising:
- at least one guide plate, the guide plate having a plurality of holes;
- at least one probe extending through at least one hole in the guide plate;
- wherein the at least one probe comprises a catch structure on its proximal end for suspending the probe in the hole of the guide plate and preventing it from passing therethrough, wherein the catch structure is selected from the group consisting of a flange and a bent portion;
- and
- placing a proximal end of the probe into engagement with a contact on a PCB or space transformer, wherein a distal end of the probe is placed into engagement with a contact on a wafer.
3 more elements
Dependencies are inferred from the claim text.