G01R 1/06766
Input circuits therefor
Official title: {Input circuits therefor}
G01R1/06766 (Input circuits therefor) appears on 256 US grants and 252 published applications in this corpus.
Search patents in G01R- Granted patents
- 256
- Published applications
- 252
- Assignees
- 127
- Inventors
- 471
- Latest grant
- 11 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 4 | 0 |
| 1978 | 2 | 0 |
| 1979 | 1 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 2 | 0 |
| 1983 | 1 | 0 |
| 1984 | 2 | 0 |
| 1985 | 0 | 0 |
| 1986 | 2 | 0 |
| 1987 | 0 | 0 |
| 1988 | 4 | 0 |
| 1989 | 3 | 0 |
| 1990 | 0 | 0 |
| 1991 | 2 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 2 | 0 |
| 1996 | 0 | 0 |
| 1997 | 2 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 3 | 0 |
| 2001 | 4 | 3 |
| 2002 | 7 | 2 |
| 2003 | 2 | 9 |
| 2004 | 7 | 9 |
| 2005 | 8 | 8 |
| 2006 | 7 | 15 |
| 2007 | 12 | 11 |
| 2008 | 6 | 11 |
| 2009 | 9 | 8 |
| 2010 | 11 | 8 |
| 2011 | 4 | 14 |
| 2012 | 5 | 10 |
| 2013 | 10 | 12 |
| 2014 | 12 | 19 |
| 2015 | 9 | 12 |
| 2016 | 11 | 7 |
| 2017 | 11 | 8 |
| 2018 | 8 | 14 |
| 2019 | 12 | 6 |
| 2020 | 7 | 7 |
| 2021 | 14 | 9 |
| 2022 | 12 | 13 |
| 2023 | 15 | 12 |
| 2024 | 5 | 9 |
| 2025 | 8 | 7 |
| 2026 | 6 | 9 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- MEMS device measurements using pulse measure unit11 Aug 2026US 12,704,542 B2Kethley Instruments, LLC
- Sensing electronic device21 Apr 2026US 12,607,652 B2Innolux Corporation
- Systems, devices, and methods for measuring direct current/low frequency signal components31 Mar 2026US 12,590,996 B2Tektronix, Inc.
- Diagnostic probe apparatus and related systems and methods24 Mar 2026US 12,584,954 B2Power Probe Group, Inc.
- Sample inspection apparatus10 Feb 2026US 12,546,805 B2Hitachi High-Tech Corporation
- Probe head for a testing apparatus of electronic devices16 Jul 2026US 2026/0202439 A1Technoprobe S.P.A.
- Diagnostic probe apparatus and related systems and methods9 Jul 2026US 2026/0194571 A1Power Probe Group, Inc.
- Automated chip testing device and automated chip testing method18 Jun 2026US 2026/0169028 A1Hosin Global Electronics Co., LTD
- Multi-sensor probes with continuous time path28 May 2026US 2026/0147018 A1Tektronix, Inc.
- Probe adapter and measurement system30 Apr 2026US 2026/0118382 A1Rigol Technologies Co., Ltd.
Most cited
By later US patents
- High bandwidth passive integrated circuit tester probe card assembly163US 6,218,910 B1FormFactor, Inc. · 2001
- Telescoping pin probe102US 4,739,259 ATektronix, Inc. · 1988
- Probe tip terminating device providing an easily changeable feed-through termination100US 6,407,562 B1Agilent Technologies, Inc. · 2002
- Probe for combined signals100US 6,724,205 B1Cascade Microtech, Inc. · 2004
- Integrated circuit tester with high bandwidth probe assembly96US 6,501,343 B2FormFactor, Inc. · 2002