Diagnostic probe apparatus and related systems and methods
AssigneePower Probe Group, Inc.
InventorDavid Douglas Barden
Life of this patent
Estimating the term…
Abstract
Apparatuses, systems, kits and methods include a diagnostic probe having a first end and a second end opposite the first end and being configured to perform an electrical analysis on the electrical component and provide an output of the electrical analysis. In some instances, an electrical test device configured to energize an electrical component, via a conductive probe element, and perform one or more electric measurements thereon is also included, where the test device includes a housing. Additionally, a conductive probe element configured to be energized by the electrical test device and placed in contact with the electrical component may energize the electrical component when energized by the electrical test device.
Claims20
A diagnostic probe apparatus, comprising:
- a first end configured to couple to a housing of an electrical test device;
- a second end configured to couple to a conductive probe element;
- one or more selectable input mechanisms configured to modify one or more settings of the diagnostic probe apparatus;
- an electronic visual display configured to display an output of an electrical analysis;
- and
- wherein the diagnostic probe apparatus is configured, based on selection of the one or more selectable input mechanisms, to modify a voltage level of an electrical signal applied to an electrical system of an electrical component via the conductive probe element.
A diagnostic probe apparatus, comprising:
- a first end configured to couple to a housing of an electrical test device;
- a second end configured to couple to a conductive probe element;
- at least two selectable input mechanisms for modifying one or more settings of the diagnostic probe apparatus;
- and
- an electronic visual display configured to display an output associated with an electrical analysis, wherein simultaneous selection of multiple of the at least two selectable input mechanisms toggles the diagnostic probe apparatus from a pulse width modulation (PWM) mode to a voltage mode and toggles the diagnostic probe apparatus from the voltage mode to the PWM mode, wherein, in the voltage mode, the diagnostic probe apparatus is configured to apply an electrical signal to an electrical system of an electrical component via the conductive probe element and to display a voltage associated with the electrical signal on the electronic visual display.
A kit for use in performing electrical diagnostics, the kit comprising:
- an electrical test device coupled to a power source and configured to energize, via a conductive probe element, an electrical component and configured to perform one or more electric measurements thereon, the test device comprising a housing;
- a diagnostic probe having a first end and a second end opposite the first end and being configured to perform an electrical analysis on the electrical component and provide an output of the electrical analysis, the diagnostic probe comprising one or more selectable input mechanisms and an electronic visual display;
- and
- the conductive probe element configured to be energized by the electrical test device and configured to be placed in contact with the electrical component,
- wherein the diagnostic probe is configured, while in voltage mode, to apply an electrical signal to an electrical system of the electrical component via the conductive probe element and to modify a voltage of the electrical signal based on selection of at least one of the one or more selectable input mechanisms.
Dependencies are inferred from the claim text.