Automated chip testing device and automated chip testing method

An automated chip testing device, comprising:

• a main body;
• a processor configured to receive a test instruction and generate and output a test signal according to the test instruction;
• at least one test socket located on the main body, coupled to the processor, and configured to be placed with a chip to be tested;
• a pressing device located on the main body, coupled to the processor, and comprising a pressing rod and at least one protruding portion disposed on the pressing rod, wherein the pressing device is configured to receive the test signal, and based on the test signal, the pressing device moves toward the at least one test socket and presses the chip to be tested in the at least one test socket through the at least one protruding portion;
• and
• at least one sensing device located on the main body and coupled to the processor, wherein the at least one sensing device is configured to receive the test signal, and based on the test signal, determine whether a distance between the at least one sensing device and an object to be sensed satisfies a predetermined condition,
• if yes, the processor starts a test program and outputs test data to the at least one test socket.