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US 12,590,996 B2Granted
Systems, devices, and methods for measuring direct current/low frequency signal components
AssigneeTektronix, Inc.
InventorMichael J. Mende
Life of this patent
Estimating the term…
Abstract
A test and measurement probe system, including an input to receive an input signal, the input signal including a low frequency (LF) and/or direct current (DC) component and an alternating current (AC) component, an extractor circuit, such as an AC coupling circuit or a LF and/or DC rejection circuit, configured to receive the input signal and to separate the AC component and the LF and/or DC component from the input signal, a first output to output the alternating current component to the test and measurement instrument, and a second output to output the direct current component to the test and measurement instrument. In some embodiments, the LF and/or DC component is digitized prior to being output by the second output.
Claims19
A test and measurement probe structured to couple to a test and measurement instrument, comprising:
- a probe input to receive an analog input signal at a probe head of the test and measurement probe, the analog input signal including a direct current/low frequency (DC/LF) component and an alternating current (AC) component;
- an amplifier coupled to the probe input;
- a DC rejection enable switch;
- a DC rejection circuit coupled through the DC rejection enable switch to an output of the amplifier, and configured to, when the DC rejection enable switch is in a closed state, receive the analog input signal and output an inverse of the DC/LF component through an offset control line to the probe head;
- a resistor network in the probe head, the resistor network coupled between the probe input, the offset control line, and an input of the amplifier, and configured to, when the DC rejection enable switch is in the closed state, add the inverse of DC/LF component to the analog input signal so that only the AC component passes through the amplifier;
- a first output to, when the DC rejection enable switch is in the closed state, output the AC component without the DC/LF component to the test and measurement instrument;
- and
- a second output to, when the DC rejection enable switch is in the closed state, output the DC/LF component to the test and measurement instrument.
5 more elements
A test and measurement system, comprising:
- a test and measurement probe including:
- a probe head having a probe input to receive an analog input signal, the analog input signal including a direct current/low frequency (DC/LF) component and an alternating current (AC) component;
- an amplifier coupled to the probe input;
- a DC rejection enable switch;
- a DC rejection circuit coupled through the DC rejection enable switch to an output of the amplifier, and configured to, when the DC rejection enable switch is in a closed state, receive the analog input signal and output an inverse of the DC/LF component through an offset control line to the probe head;
- a resistor network in the probe head, the resistor network coupled between the probe input, the offset control line, and an input of the amplifier, and configured to, when the DC rejection enable switch is in the closed state, add the inverse of DC/LF component to the analog input signal so that only the AC component passes through the amplifier;
- a first output structured to, when the DC rejection enable switch is in the closed state, output the AC component signal without the DC/LF component signal;
- a second output structured to, when the DC rejection enable switch is in the closed state, output the DC/LF component signal;
- and
- a test and measurement instrument including:
- a first input structured to receive the AC component signal without the DC/LF component signal;
- and
- a second input structured to receive the isolated DC/LF component signal.
10 more elements
A method, comprising:
- receiving an analog input signal at an input of a probe head of a test and measurement probe, the analog input signal including a direct current/low frequency (DC/LF) component and an alternating current (AC) component;
- amplifying the analog input signal using an amplifier in the probe head;
- closing a DC rejection enable switch to enable a DC rejection circuit;
- when the DC rejection enable switch is closed, using the DC rejection circuit to receive the analog input signal and output an inverse of the DC/LF component through an offset control line to the probe head;
- when the DC rejection enable switch is closed, adding, using a resistor network in the probe head, the inverse of DC/LF component to the analog input signal so that only the AC component passes through the amplifier;
- transmitting, when the DC rejection enable switch is closed, the AC component without the DC/LF component to a test and measurement instrument through a first output of the test and measurement probe;
- and
- transmitting, when the DC rejection enable switch is closed, the DC/LF component to the test and measurement instrument through a second output of the test and measurement probe.
5 more elements
Dependencies are inferred from the claim text.