Probe adapter and measurement system
AssigneeRigol Technologies Co., Ltd.
InventorsKai YANG, Liming WANG, Yue WANG
Life of this patent
Estimating the term…
Loading patent…
AssigneeRigol Technologies Co., Ltd.
InventorsKai YANG, Liming WANG, Yue WANG
Estimating the term…
The present disclosure relates to a probe adapter and a measurement system, including: a first interface, configured to be electrically connected to a probe; a second interface, configured to be electrically connected to a measuring instrument; signal transmission lines, including first and second signal transmission lines, and a line selection switch, where the first and second signal transmission lines are both located between the first interface and the second interface, and the line selection switch is configured to select the first signal transmission line or the second signal transmission line to conduct the first interface and the second interface; and a signal conditioning circuit, located on the second signal transmission line, and configured to adjust an impedance of a measured signal to match an input impedance of the measuring instrument, and/or adjust an amplitude of the measured signal to match a measurement range of the measuring instrument.
A probe adapter, comprising:
Dependencies are inferred from the claim text.