Multi-sensor probes with continuous time path
AssigneeTektronix, Inc.
InventorMark A. Norris
Life of this patent
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Abstract
A test and measurement probe device is disclosed. In some implementations, the device may include one or more sensors. In addition, the device may include a plurality of analog signal paths, each analog signal path connected to one of the one or more sensors. The device may include an adjustable gain element within each analog signal path. Moreover, the device may include a combiner to combine the output of each adjustable gain element together to produce a probe output signal. Also, the device may include a digital path including a processor, where the processor is configured to compute a gain value for at least one adjustable gain element.
Claims20
A test and measurement probe, comprising:
- one or more sensors;
- a plurality of analog signal paths, each analog signal path connected to one of the one or more sensors;
- an adjustable gain element within each analog signal path;
- a combiner to combine the output of each adjustable gain element together to produce a probe output signal;
- and
- a digital path including a processor, wherein the processor is configured to compute a gain value for at least one adjustable gain element.
Dependencies are inferred from the claim text.