Back to results
US 12,716,915 B2Granted
Probe
AssigneeKabushiki Kaisha Nihon Micronics
InventorAkihiro Shuto
Life of this patent
Estimating the term…
Abstract
The probe has a main body and a spring portion having an electrical resistivity and elastic modulus greater than the main body, and the main body and the spring portion are connected in parallel. The main body has a structure in which a tip part, an elastically deformable barrel, and a base end part are connected in this order. The spring portion has a structure in which a first joint joined to the tip part, an elastic deformation part, and a second joint joined to the base end part are connected in this order.
Claims8
A probe comprising:
- a main body having a structure in which a tip part, a barrel, and a base end part are connected in this order;
- and
- a spring portion having a structure in which a first joint joined to the tip part, an elastic deformation part that is elastically deformed, and a second joint joined to the base end part are connected in this order, and having an electrical resistivity and an elastic modulus greater than the main body;
- wherein the main body and the spring portion are connected in parallel.
1 more element
Dependencies are inferred from the claim text.