A probe head having high frequency performances

A probe head for the testing of electronic devices, comprising:

• at least one contact probe comprising a body extending between a first end and a second end, said ends being adapted to contact respective contact pads;
• and
• at least one guide comprising at least one guide hole configured to house at least one portion of the contact probe,
• wherein the contact probe comprises at least one intermediate section arranged between the first end and the second end, said intermediate section being elastically compliant,
• wherein the contact probe has a length which is less than 2000 μm, preferably less than 1000 μm, still more preferably equal to or less than 800 μm, said length being measured along a longitudinal axis of said contact probe, and
• wherein the probe head further comprises a conductive portion formed on the guide said conductive portion including at least one group of said guide holes and being adapted to contact and short-circuit a corresponding group of contact probes that are housed in said group of holes and intended to carry a given type of signal, thereby forming a conductive domain, wherein at least one portion of the contact probe is in contact with said conductive portion.