US 2026/0298977 A1Published application

Probe head with contact probes having an improved configuration

AssigneeTechnoprobe S.P.A.

InventorsRaffaele VALLAURI, Nadia PADERNO, Camilla CAMARRI, Giulia STUCCHI, Stefano FELICI, Fabio MORGANA, Roberto CRIPPA, Giuseppe CRIPPA

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Abstract

A probe head for the testing of electronic devices is disclosed having a contact probe that includes a body which extends between first and second ends adapted to contact respective contact pads, and a guide having a guide hole configured for housing at least a portion of the contact probe. The contact probe includes an intermediate section arranged between the first and second ends which is elastically compliant, wherein the elastically compliant intermediate section is structured as a plurality of elastic elements which follow one another in series so that the elastically compliant intermediate section is not rectilinear. At least one of the elastic elements is in contact with a wall of the guide hole.

Claims11

Dependent claims

A probe head for testing electronic devices, comprising:

at least one contact probe comprising a body which extends between a first end and a second end, said ends being adapted to contact respective contact pads;
and
at least one guide comprising at least one guide hole configured to house at least one portion of the contact probe,
wherein the contact probe comprises at least one intermediate section arranged between the first end and the second end said intermediate section being elastically compliant, and
wherein the elastically compliant intermediate section is structured as a plurality of elastic elements which follow one another in series in such a way that said elastically compliant intermediate section is not rectilinear, wherein at least one of said elastic elements is in contact with a wall of the guide hole.

2 more elements

Dependencies are inferred from the claim text.