G01R 1/06727
Cantilever beams
Official title: {Cantilever beams}
G01R1/06727 (Cantilever beams) appears on 357 US grants and 431 published applications in this corpus.
Search patents in G01R- Granted patents
- 357
- Published applications
- 431
- Assignees
- 151
- Inventors
- 640
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 3 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 3 | 0 |
| 1999 | 3 | 0 |
| 2000 | 2 | 0 |
| 2001 | 9 | 10 |
| 2002 | 14 | 21 |
| 2003 | 13 | 20 |
| 2004 | 17 | 14 |
| 2005 | 17 | 19 |
| 2006 | 11 | 27 |
| 2007 | 17 | 35 |
| 2008 | 12 | 44 |
| 2009 | 40 | 27 |
| 2010 | 29 | 34 |
| 2011 | 22 | 20 |
| 2012 | 15 | 15 |
| 2013 | 13 | 11 |
| 2014 | 10 | 11 |
| 2015 | 13 | 8 |
| 2016 | 3 | 9 |
| 2017 | 10 | 5 |
| 2018 | 8 | 7 |
| 2019 | 4 | 14 |
| 2020 | 11 | 11 |
| 2021 | 8 | 12 |
| 2022 | 10 | 14 |
| 2023 | 8 | 12 |
| 2024 | 14 | 14 |
| 2025 | 3 | 6 |
| 2026 | 10 | 11 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Probe systems and methods of operating probe systems8 Sep 2026US 12,730,143 B2FormFactor, Inc.
- Cantilever probe card device and cantilever probe module23 Jun 2026US 12,663,439 B2Chunghwa Precision Test Tech. Co., Ltd.
- Cantilever probe card device and climb-restricting probe12 May 2026US 12,625,163 B2Chunghwa Precision Test Tech. Co., Ltd.
- Probe device, probe system including the probe device and operating method thereof12 May 2026US 12,625,164 B2Star Technologies Inc.
- Socketed probes14 Apr 2026US 12,601,758 B2
- Cantilever holder structure with attached electrical components for a cantilever-card assembly and methods of forming the same8 Oct 2026US 2026/0309748 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Socketed Probes24 Sep 2026US 2026/0287613 A1
- Electrical contactor20 Aug 2026US 2026/0246180 A1Kabushiki Kaisha Nihon Micronics
- Vertical mems probe having tethering structure and manufacturing method thereof2 Jul 2026US 2026/0186021 A1Withmems Co., Ltd.
- Probe for electrical connection apparatus21 May 2026US 2026/0140141 A1Kabushiki Kaisha Nihon Micronics
Most cited
By later US patents
- Contact carriers (tiles) for populating larger substrates with spring contacts304US 5,806,181 AFormFactor, Inc. · 1998
- Lithographic contact elements265US 6,255,126 B1FormFactor, Inc. · 2001
- High density cantilevered probe for electronic devices262US 5,811,982 AInternational Business Machines Corporation · 1998
- Microprobe240US 5,475,318 ARoxburgh Ltd. · 1995
- Method of making microelectronic spring contact elements226US 6,184,053 B2FormFactor, Inc. · 2001