Cantilever probe card device and climb-restricting probe

A climb-restricting probe, comprising:

• an arm segment;
• a main segment located at one side of the arm segment, wherein the main segment has a soldering end portion and an extending end portion respectively located at two opposite sides thereof along a predetermined direction;
• a testing segment having an upright shape along the predetermined direction and connected to another side of the arm segment;
• and
• a climb-restricting ring surrounding the main segment along a top edge of the soldering end portion and protruding from an outer surface of the main segment;
• wherein the climb-restricting ring has a restriction height along the predetermined direction, wherein the restriction height is within a range from 3 μm to 50 μm, and wherein the climb-restricting ring is capable of blocking a solder, such that the solder does not climb past the climb-restricting ring along the predetermined direction;
• wherein the climb-restricting probe includes a light absorption coating layer, and wherein the testing segment includes a pinpoint portion and an upright portion that connects the pinpoint portion and the arm segment and that is covered by the light absorption coating layer, and the pinpoint portion is exposed from the light absorption coating layer, so that through the light absorption coating layer, the testing segment only forms an observation point at the pinpoint portion in an observation process of a detection apparatus.

A climb-restricting probe, comprising:

• an arm segment;
• a main segment located at one side of the arm segment, wherein the main segment has a soldering end portion and an extending end portion respectively located at two opposite sides thereof along a predetermined direction;
• a testing segment having an upright shape along the predetermined direction and connected to another side of the arm segment;
• and
• a climb-restricting ring surrounding the main segment along a top edge of the soldering end portion and protruding from an outer surface of the main segment;
• wherein the climb-restricting ring has a restriction height along the predetermined direction, wherein the restriction height is within a range from 3 μm to 50 μm, and wherein the climb-restricting ring is capable of blocking a solder, such that the solder does not climb past the climb-restricting ring along the predetermined direction;
• wherein the testing segment includes a pinpoint portion and an upright portion that connects the pinpoint portion and the arm segment and that has a roughened surface arranged on an entirety of an outer surface thereof, the roughened surface having an arithmetic average roughness (Ra) within a range from 0.1 μm to 1 μm, so that through the roughened surface, the testing segment only forms an observation point at the pinpoint portion in an observation process of a detection apparatus.